A method for real-time monitoring of semiconductor test data

A technology of test data and real-time monitoring, applied in the direction of single semiconductor device testing, data processing application, comprehensive factory control, etc., can solve the problems of inability to monitor test data in real time, inconvenience of GPIB card, etc., to achieve rich data content and save initial investment costs , the effect of real-time unified data

Active Publication Date: 2017-02-15
上海竺舜信息科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] In order to solve the problem that the test data cannot be monitored in real time and the inconvenience caused by adding a GPIB card during semiconductor testing, the present invention provides a real-time monitoring system and monitoring method for semiconductor test data

Method used

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  • A method for real-time monitoring of semiconductor test data
  • A method for real-time monitoring of semiconductor test data

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Embodiment Construction

[0029] Below in conjunction with accompanying drawing, preferred scheme of the present invention is further elaborated:

[0030] A real-time monitoring system for semiconductor testing data, comprising: a client for reading and uploading relevant data generated by a testing machine program. The server that reads the data uploaded by the client and performs analysis and comparison. A display terminal that displays the data after comparison between servers. The client, server and display terminal are connected through data interaction.

[0031] The client includes a reading module, an integrating module and a sending module. The reading module reads the data of each site testing machine software, the integration module integrates the data read by the reading module into a unified format, the sending module uploads the integrated data to the server, and the reading Modules, integration and sending modules are connected through data interaction. As a more preferred manner, the...

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Abstract

The invention relates to a real-time monitoring system and a real-time monitoring method of semiconductor test data. The real-time monitoring system comprises a client, a server and a display terminal, wherein the client is used for reading relevant data generated by a test machine and uploading the relevant data to the server; the server is used for reading the data uploaded by the client, carrying out analysis and comparison to obtain the operating state of the test machine and updating the data of the server; the display server is used for displaying new data after comparison of the server and the state of the test machine; the client, the server and the display terminal are connected through data interaction. After the technical scheme is adopted, the system can be compatible with various models of test machines, the data are free of man-made zero-clearing, and the data are rich in content. Due to the fact that all information of program of the test machine can be read, new hardware does not need to be added, and the input cost in earlier stage is reduced.

Description

technical field [0001] The invention relates to the field of semiconductor test data monitoring, in particular to a monitoring system capable of real-time monitoring of semiconductor test data and a monitoring method thereof. Background technique [0002] At present, the data monitoring in semiconductor testing mainly adopts the MES system. The MES system is the manufacturing execution system (manufacturing execution system, referred to as MES). MES can provide enterprises with manufacturing data management, planning and scheduling management, production scheduling management, and inventory management. , quality management, human resource management, work center / equipment management, tooling management, procurement management, cost management, project Kanban management, production process control, bottom data integration analysis, upper data integration and decomposition and other management modules. However, the MES system focuses on the execution of the workshop operation ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/418H04L29/06G01R31/26G06Q50/04
CPCY02P90/02Y02P90/30
Inventor 于兵
Owner 上海竺舜信息科技有限公司
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