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Time-domain dynamic correction method for cable measurement errors in temperature test

A technology of temperature test and measurement error, applied in the direction of measuring electricity, measuring device, measuring electrical variables, etc., can solve the problems of not high temperature lower limit, complicated calibration method, long time-consuming calibration, etc., so as to achieve no increase in test cost and true test results. accurate effect

Active Publication Date: 2014-12-17
XIAN INSTITUE OF SPACE RADIO TECH
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Problems solved by technology

The advantage of this method is real real-time compensation calibration. The disadvantage is the accuracy of the temperature data of the calibration piece. The calibration method when the calibration period of the automatic calibration piece itself expires is complicated and the calibration takes a long time. Moreover, the electronic switch and the calibration piece The lower temperature limit given is often not high enough, such as -40°C or even -25°C

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  • Time-domain dynamic correction method for cable measurement errors in temperature test
  • Time-domain dynamic correction method for cable measurement errors in temperature test
  • Time-domain dynamic correction method for cable measurement errors in temperature test

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Embodiment Construction

[0040] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings of the specification.

[0041] Such as figure 2 Shown is the schematic diagram of the cable connection relationship between the test instrument and the DUT. figure 2 It can be seen that when performing a temperature test, the device under test (the cable under test) is placed inside the incubator, and is connected to the device under test through the upstream test cable and the downstream test cable.

[0042] Such as figure 1 Shown is the invention flow chart of the present invention, by figure 1 It can be seen that the method for dynamically correcting cable measurement errors in the time domain in the temperature test provided by the present invention has the following steps:

[0043] (1) Before connecting the tested product, calibrate the vector network analyzer used in the temperature test to eliminate the internal error of the vector network...

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Abstract

The invention discloses a time-domain dynamic correction method for cable measurement errors in a temperature test. When radio frequency microwave products are tested in a laboratory, radio frequency cables are needed to be used for connecting the detected products with instruments. In order to guarantee accuracy of a product test, the cables must be tested singly before usage to obtain characteristic parameters of the cables, and errors introduced by the cables are corrected in a test system. But when the detected products enter a temperature chamber for a high-low temperature cycling test, the characteristic parameters of the radio frequency cables change along with high and low temperatures, and furthermore, the cables are already connected with the detected products and the instruments in the temperature chamber, single correction can not be carried out, so accuracy of the product test is lowered. By the aid of the method, a problem that the radio frequency test cables can't be tested during temperature cycling is solved, the real-time characteristic parameters of the radio frequency cables in a high-low temperature chamber can be acquired, the acquired cable parameters are used for correcting a test result, and accurate product test in a temperature cycling test can be achieved.

Description

Technical field [0001] The invention relates to a method for dynamically correcting cable measurement errors in the temperature test in the time domain, which realizes the accurate test of satellite payload and component products in the temperature cycle test, corrects the influence of the error caused by the test connection cable, and is suitable for various Class satellite payload department, accurate testing in the temperature cycle of component products. Background technique [0002] Satellite payloads and component products usually need to undergo a temperature cycle test. The purpose is to monitor satellite payloads, whether component products work normally in an alternating temperature environment, and whether the technical indicators meet the overall requirements, so as to ensure the normal performance of the satellite in orbit . Microwave payloads and component products often need to use high-frequency test cables to connect the products in the incubator and the test in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26G01R25/00G01R31/00
Inventor 王伟朱宜东李新雷王学科杨晓敏左刚谢静
Owner XIAN INSTITUE OF SPACE RADIO TECH
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