Time-domain dynamic correction method for cable measurement errors in temperature test
A technology of temperature test and measurement error, applied in the direction of measuring electricity, measuring device, measuring electrical variables, etc., can solve the problems of not high temperature lower limit, complicated calibration method, long time-consuming calibration, etc., so as to achieve no increase in test cost and true test results. accurate effect
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[0040] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings of the specification.
[0041] Such as figure 2 Shown is the schematic diagram of the cable connection relationship between the test instrument and the DUT. figure 2 It can be seen that when performing a temperature test, the device under test (the cable under test) is placed inside the incubator, and is connected to the device under test through the upstream test cable and the downstream test cable.
[0042] Such as figure 1 Shown is the invention flow chart of the present invention, by figure 1 It can be seen that the method for dynamically correcting cable measurement errors in the time domain in the temperature test provided by the present invention has the following steps:
[0043] (1) Before connecting the tested product, calibrate the vector network analyzer used in the temperature test to eliminate the internal error of the vector network...
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