Spectrum measurement method and system for improving luminous flux

Abstract

The invention provides a spectrum measurement method and system for improving luminous flux. According to the method, the width of an incidence slit in a traditional chromatic dispersion spectrograph or a traditional spectrum measurement system is increased, a set of imaging lenses for measuring zero-level spectrums is additionally arranged behind an optical grating in the traditional chromatic dispersion spectrograph or the traditional spectrum measurement system, the mathematic relation between the zero-level spectrums and one-level spectrums measured in the original spectrum measurement system is utilized, and new spectrums are obtained through calculation. The new spectrums have more light energy compared with the spectrums obtained by the traditional spectrum measurement system adopting a small slit; meanwhile, the high resolution possessed by the spectrum measurement system adopting the small slit can also be kept. The method and the system can effectively improve the luminous flux of an incidence optical spectrum instrument, and the higher spectrum resolution can be kept through mathematical calculation.

Description

technical field [0001] The invention relates to the technical fields of spectroscopy, spectral measurement and instruments, in particular to a spectral measurement method and system for improving luminous flux. Background technique [0002] Spectral working range, spectral resolution, luminous flux, detection noise and dynamic range are the main parameters reflecting the performance of spectroscopic instruments. In many applications, the above parameters are very important. For example: higher spectral resolution can obtain finer structural information of the target spectrum, thus allowing more detailed analysis. Higher luminous flux can improve the sensitivity of detecting substances and reduce the detection limit. [0003] Since William Wollaston used the slit in the dispersive spectrometer in 1802 to improve the spectral resolution of the spectrometer, the slit has become an important part of the dispersive spectrometer. However, a slit with a smaller width blocks most...

AI Technical Summary

Problems solved by technology

For CAS, only the code hole is small enough to achieve better resolution, however, the optical diffraction and optical blur caused by the small code hole have a certain impact on the measurement results

The core component of the traditional FTS is the interferometer, and the mechanical scanning elements in the system complicate the structure and overall assembly of the instrument

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