14 results about "Spectroscopy instrumentation" patented technology

This invention discloses an in-situ Raman testing device suitable for high-pressure flow three-phase interfaces, belonging to the field of spectroscopic instrument accessories and instrumental analysis technology. It includes a gas chamber, a cathode chamber insulating clamp, a cathode chamber, a cover plate, an anode chamber insulating clamp, an anode chamber, and optical glass. This invention features simple assembly, good sealing, and facilitates the acquisition of high-quality Raman spectral information. Furthermore, the device allows the reaction cell to be embedded in the sample stage of a Raman spectrometer, the solution pipeline to be connected to a pressure-controlled balancing device, and to an electrochemical workstation and Raman system, enabling optical signal testing under high-pressure flow three-phase interface conditions. It has proven highly effective in the mechanistic and applied research of electrocatalytic / photoelectrocatalytic reactions using practical gas diffusion electrodes.

The application provides a prediction method for iron oxide and metal micro combination form, S1, a data set for establishing a machine learning model; S2, based on the chemical connotation corresponding to the missing data in the data set, the missing data is filled, and a pretreated sample data set is obtained; S3, the pretreated sample data set is randomly divided into a training set and a test set; S4, an algorithm for machine learning is selected, hyperparameter optimization is performed on the training set, the optimal effect is selected, and the test set is evaluated, and an iron oxide and metal micro combination form prediction model is obtained; S5, the test sample data is substituted into the iron oxide and metal micro combination form prediction model, and an iron oxide and metal micro combination form prediction result is obtained. The problems that the prior art cannot provide coordination number and coordination bond length information on the micro level, the test operation of the advanced spectral instrument is complex, the cost is high, and the application universality is not possessed are solved.

The invention relates to the technical field of optical spectrum instrument design, in particular to an infrared light refractive index and transmissivity testing system and method for infrared optical glass, and the system comprises an infrared light source unit, a monochromator unit, a precise angle measuring unit, a general control unit and an upper computer data processing system. Incident light is divided into sample light and reference light through the double-beam light splitting module, the refraction angle and the light intensity of light beams penetrating through a sample are automatically tracked and measured by utilizing the self-positioning aiming mobile table, and meanwhile, an optical path compensation module and a full-automatic temperature control system are combined, so that the aim of measuring the light intensity of the sample within a set broadband and temperature range is achieved. And the refractive index, the reflectivity and the transmissivity parameters of a prism or window sample are subjected to integrated and high-precision synchronous measurement. The technical problems that in the prior art, multiple instruments are relied on, the operation process is complex, efficiency is low, and accurate measurement is difficult to conduct under the variable temperature condition are effectively solved.

This invention discloses a method for fabricating a large-aperture convex grating with a high-depth-width blazed groove shape. The method includes: confirming the grating line density using dispersion theory; determining the grating's operating temperature under corresponding wavelength radiation backgrounds; determining the grating substrate material; performing a rough calculation of the blaze angle using scalar diffraction theory; performing a precise calculation of the blaze angle using the finite-difference time-domain method; determining the film material and thickness; designing the consistency of TE and TM diffraction efficiencies; analyzing the grating groove shape difference; confirming the grating groove shape parameters; electron beam exposure and development of the blazed groove shape; designing, exposing, and developing the exposure dose compensation; stitching together the large-aperture grating exposure areas; ion beam etching of the grating; and coating the grating with a metal reflective film. This fabrication method ensures the stability of the diffraction efficiency of the grating substrate and film materials under varying temperatures from room temperature to deep cryogenics, as well as the consistency of TE and TM diffraction efficiencies, thus guaranteeing the imaging quality and response stability of spectroscopic instruments.

Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a method of supporting spectroscopic calibration may include: generating a base calibration model using data from multiple base spectroscopic instruments, and finetuning the base calibration model using data from a target spectroscopic instrument to generate a target calibration model for use with the target spectroscopic instrument. In some embodiments, the number of wavelengths used in generating the base calibration model and / or the target calibration model may be less than the total number of wavelengths represented in the output of the spectroscopic instruments.

This invention relates to the field of spectroscopic instrument calibration technology, and discloses a spectral wavelength calibration method based on grating dispersion and spatial filtering, comprising: 1. incident collimated light from a broadband light source onto a grating; 2. setting a spatial filter that can move along the dispersion direction near the image plane of the dispersive optical path, and selecting narrowband light with different center wavelengths from the continuous spectrum by moving the filter; 3. for each filter position, measuring the center wavelength of the selected narrowband light using a high-precision spectrometer, and capturing a spot image using a detector array to be calibrated; 4. extracting the centroid pixel coordinates of the spot from the image; 5. fitting the wavelength and pixel coordinates to establish a calibration equation between the pixel coordinates and the wavelength. This invention does not overly rely on discrete standard light sources, can actively and continuously acquire high-density calibration points, the process is easy to automate, and the calibration accuracy is high, making it suitable for online calibration of miniaturized and integrated spectrometers.

The present application relates to the technical field of micro-spectrometer devices, and particularly relates to a micro-spectrometer based on van der Waals heterojunction, which comprises a spectrum detection unit and a spectrum inversion unit. The spectrum detection unit comprises a substrate, a heterojunction functional layer, a metal electrode and a gate voltage regulation module. The heterojunction functional layer is arranged on the substrate and forms a van der Waals heterojunction in the heterojunction functional layer. The metal electrode is ohmically connected to the heterojunction functional layer and outputs spectrum sampling data. The gate voltage regulation module is ohmically connected to the substrate, changes the light response characteristics of the spectrum detection unit, and makes the spectrum detection unit output different spectrum sampling data under different gate voltage conditions. The spectrum inversion unit is applied to the spectrum detection unit, performs inversion processing on the spectrum sampling data, and outputs corresponding inversion spectrum data. The present application also includes a measurement method and a preparation method. The present application can realize micro-spectrometer detection in a wide spectrum range and improve the accuracy and efficiency of spectrum inversion.

A method of determining components present in a sample from spectral data obtained from the sample including resolving each of a plurality of models of the spectral data, the plurality of models including models having a different number of component reference spectra selected from a set of predetermined component reference spectra; selecting a one of the plurality of models based upon a model selection criterion and determining one or more components present in the sample based upon the selected model. The model selection criterion includes a measure for each model, which balances improvements in fit quality of the model to the spectral data against a complexity penalty determined from the number of component reference spectrum used in the model.

A method and a system to improve the quantitative accuracy and sensitivity of spectral channels of a high-sensitivity optical spectrometry instrument via a computer, comprising the following steps of Using the high-sensitivity optical spectrometry instrument to scan at least one sample in a well plate and forwarding the resulting signal data to the computer; Removing scan defects in the signal data via a software hosted by the computer by identifying photon count bins in the signal data using statistical analysis of underlying photon counting distribution with outlying bins; Extracting signal responses in multiscale via the software to increase the detection sensitivity by maximizing the response SNR, and to widen the response dynamic range by adaptively extending the signal response at the top of standard curve; and Providing real-time feedback of the extracted signal response applying it via the software to the high-sensitivity optical spectrometry instrument while the raw photon count trace is being collected during the scan of the well plate, thereby improving the quantitative accuracy and sensitivity of its spectral channels.

A method for measuring with a primary reference standard and for potentially adjusting and / or calibrating a high-sensitivity spectrometer via a computer includes the following steps: using a high-purity H₂O solution as a primary standard stored in a container; exciting the standard using at least one excitation laser; collecting and measuring Raman scattering from the standard using a detector of the instrument, in the form of Stokes, anti-Stokes, or both; applying a correction method to correct for variations in Raman scattering caused by the container to improve measurement accuracy; measuring and integrating the intensity over a fixed detection bandwidth of the Raman scattering spectrum to calculate the instrument's optical efficiency; and potentially adjusting and / or calibrating the high-sensitivity spectrometer based on the calculated instrument optical efficiency.

The invention relates to a Fraunhofer spectral line benchmark-based generation and calibration method and system and a medium, and the method comprises the steps: measuring direct solar radiation spectrums at different solar zenith angles through a foundation spectrum instrument, and calculating the atmosphere quality of each spectrum measurement moment in each direct solar radiation spectrum; calculating solar spectral irradiance at the top of the earth atmosphere; selecting a non-absorption wave band which is not interfered by the atmosphere according to the atmosphere transmittance; and searching a Fraunhofer line in a non-absorption wave band, and carrying out spectrum calibration on a foundation spectrum instrument. According to the invention, the calibration does not need a laboratory standard lamp, and the problems of standard lamp attenuation and transmission errors are avoided; according to the method, areas which are not affected by the atmosphere in the spectrum can be distinguished and utilized, the method is not affected by the atmosphere, the method has good precision and long-term stability, the Fraunhofer line area AM0 spectrum extrapolation precision is improved, and the foundation spectrum instrument is calibrated by using the stable Fraunhofer line.

This invention relates to an absorption spectroscopy calibration device and method, belonging to the field of spectral parameter measurement. The device includes a furnace tube and light guide assemblies symmetrically arranged at both ends of the furnace tube. Each light guide assembly includes a light guide tube and windows sealingly connected to both ends of the light guide tube. One end of the light guide tube extends into the cavity of the furnace tube and is suspended in the middle region of the cavity, while the other end of the light guide tube is located outside the furnace tube. The light guide assembly provides a vacuum transmission optical path for spectral instrument calibration. This invention, by using the furnace tube and its inner cavity as a sealed cavity, the symmetrically arranged light guide assemblies at both ends of the furnace tube, and the arrangement of the light guide tube and the windows sealingly connected to both ends of the light guide tube, not only provides a sealed calibration environment but also, by using the sealed space of the light guide tube as a vacuum transmission optical path, replaces the optical path of laser light in these optical media with the optical path in a vacuum, reducing light intensity loss and improving the measurement signal-to-noise ratio.

The Raman spectrometer comprises an optical input unit (16), optical selectors (32) and (33) configured to selectively determine a pair of optical systems (30a) and (34a) selected from different pairs, and a photodetector (24) configured to disperse the incident light received by the optical input unit (16) into a spectrum, and to detect the spectrum. When a different pair of optical systems (30a), (30b), (30c), (30d); (34a), (34b), (34c), (34d) is selected from the set, the spectrum that can be detected by the photodetector (24) changes.

The application discloses an exposure writing field splicing method of an electron beam spherical grating, and the splicing process comprises the following steps: calculating the writing field size; calculating the writing field splicing interval of the spherical grating; focusing on a spherical reference point and locally exposing; identifying the writing field splicing error; adjusting and controlling the writing field splicing error; modifying and compensating the consistency of the writing field pattern of each region of the spherical grating; and exposing by the electron beam after converting the error of the whole region writing field. The exposure writing field splicing method of the electron beam spherical grating provided by the application guarantees the consistency of the writing field splicing and the pattern of each region of the spherical grating, reduces the surface roughness of the electron beam spherical grating, avoids the appearance of the secondary peak of the imaging Airy disk caused by the splicing error, and guarantees the imaging quality and the spectral resolution of the spectral instrument.