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237 results about "Planar Imaging" patented technology

Implementation of a gamma camera to obtain 2D images with no tomographic reconstruction process being involved.

Sub-diffraction limit image resolution in three dimensions

The present invention generally relates to sub-diffraction limit image resolution and other imaging techniques, including imaging in three dimensions. In one aspect, the invention is directed to determining and/or imaging light from two or more entities separated by a distance less than the diffraction limit of the incident light. For example, the entities may be separated by a distance of less than about 1000 nm, or less than about 300 nm for visible light. In some cases, the position of the entities can be determined in all three spatial dimensions (i.e., in the x, y, and z directions), and in certain cases, the positions in all three dimensions can be determined to an accuracy of less than about 1000 nm. In one set of embodiments, the entities may be selectively activatable, i.e., one entity can be activated to produce light, without activating other entities. A first entity may be activated and determined (e.g., by determining light emitted by the entity), then a second entity may be activated and determined. The emitted light may be used to determine the x and y positions of the first and second entities, for example, by determining the positions of the images of these entities, and in some cases, with sub-diffraction limit resolution. In some cases, the z positions may be determined using one of a variety of techniques that uses intensity information or focal information (e.g., a lack of focus) to determine the z position. Non-limiting examples of such techniques include astigmatism imaging, off-focus imaging, or multi-focal-plane imaging.
Owner:PRESIDENT & FELLOWS OF HARVARD COLLEGE

Rapidly converged scene-based non-uniformity correction method

InactiveCN102538973APrevent erroneous updatesBug update avoidanceRadiation pyrometryPhase correlationSteep descent
The invention discloses a rapidly converged scene-based non-uniformity correction method, wherein the aim of non-uniformity correction is achieved by minimizing interframe registration error of two adjacent images. The method mainly comprises the following steps of: initializing gain and offset correction parameters and acquiring an uncorrected original image; acquiring a new uncorrected original image, and carrying out non-uniformity correction on the new uncorrected original image and the previous uncorrected original image by utilizing the current non-uniformity correction parameters; obtaining relative displacement, scene correlation coefficient and interframe registration error of two corrected images by utilizing an original point masking phase correlation method; and updating correction parameters along the negative gradient direction by adopting a steepest descent method. The method disclosed by the invention has the advantages of high correction accuracy, fast convergence speed, no ghost effect and low calculated amount and storage content and is especially applicable to being integrated into an infrared focal plane imaging system, and the effect of improving imaging quality, environmental suitability and time stability of an infrared focal plane array is achieved.
Owner:NANJING UNIV OF SCI & TECH

Liquid crystal screen defect layered positioning method and device

ActiveCN105842885ADistinguishing Interference QuicklySimple production processNon-linear opticsCamera imageStereoscopic imaging
The invention relates to an embodiment disclosing a liquid crystal screen defect layered positioning method and device; the method comprises the following steps: controlling a plurality of cameras for imaging, wherein a camera view field overlap area covers a to-be-detected liquid crystal screen; using the to-be-detected liquid crystal screen surface as the reference surface, calibrating a mapping relation T between each camera image coordinate system; respectively mapping defect point image coordinates corresponding to each camera into the same image coordinate system according to the mapping relation T; determining whether the defect is on the reference surface or not according to the mapped corresponding defect point image coordinate deviation, and identifying inner / outer layer defects; in addition, using a mapping relation G between the camera image coordinates and object space coordinates to accurately calculate the defect point depth coordinate, thus determining the defect layer. Using various cameras to form the visual system, so the plane image defect detection can be improved to form stereo imaging, thus determining detect points and plane positions, obtaining depth information, completing defect points inner / outer layer positioning and grading, helping to remove interferences, and guiding technology improvement so as to ensure liquid crystal screen quality.
Owner:BEIJING LUSTER LIGHTTECH

Raster imaging spectrometer

The invention provides a raster imaging spectrometer which comprises a preposed receiving optics unit, a light split imaging unit comprising an entrance slit, a plane mirror, a collimating-focusing system and a raster, and a spectral signal processing unit comprising an area array photoelectric detector and a signal processing system. The entrance slit is arranged at the focal point of an emergent light ray of the preposed receiving optics unit; the emergent light ray of the preposed receiving optics unit penetrates through the entrance slit to be capable of reaching the reflecting surface of the plane mirror; the collimating-focusing system is arranged on the reflected light ray of the plane mirror and is coaxial with the raster; the reflected light ray of the raster on the plane mirror passes through the collimating-focusing system-collimated emergent light ray; the area array photoelectric detector is positioned at the focal point of the diffracted light ray of the emergent light ray focused by the collimating-focusing system, of the raster; and an output end of the area array photoelectric detector is connected with an input end of the signal processing system. The raster imaging spectrometer provided by the invention has the advantages of being simple in structure, high in stability, high in spectral resolution, small in volume, low in price, capable of planar imaging, etc.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
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