The invention relates to a photoelectric marking technology, in particular to an active photoelectric marking method for an MEMS (Micro-electromechanical Systems)
infrared light supply array. The invention solves the problem that the conventional photoelectric marking technology is greatly impacted by external environment, cannot meet the requirements of all-weather work, cannot be used for invisible marking under an asymmetrical condition, is low in identifying efficiency, and is small in the range of a reflected light viewing field. The active photoelectric marking method for the MEMS
infrared light supply array is achieved by adopting the following steps: a, an
infrared light supply array module is manufactured; b, the
radiation signals of an FPGA (Field Programmable Gata Array), used for controlling the infrared light supply array module, are simple point infrared spot signals; and c, the
radiation signals of the FPGA, used for controlling the infrared light supply array module, are cyclic switching raster graphic signals. The active photoelectric marking method for the MEMS infrared light supply array, provided by the invention, is applicable to the fields of
airplane falling guidance, pilotage, routing indication, bridge marking, personnel
search and rescue, subaerial space
wireless communication, identification and tracking of military targets, and the like.