The present invention belongs to the field of
organic semiconductor technology, and specifically provides a multiplication-type organic
photodetector based on high-
temperature induced interface traps, which is used to solve the problems of low response speed, high
operating voltage and complex process of existing multiplication-type organic photodetectors. The present invention comprises: a substrate, a transparent conductive
cathode, a
cathode modification layer, a photosensitive layer, an
anode modification layer and an
anode layer stacked in sequence from bottom to top; wherein the photosensitive layer is subjected to high-temperature thermal annealing treatment, so that a granular defect morphology is formed on its upper surface as an interface trap, so that photogenerated carriers are trapped and accumulated at the interface, thereby inducing interface energy
band bending and tunneling injection of
external circuit charges, generating a
photomultiplier effect, and thus significantly improving the external
quantum efficiency of the device and enhancing the
detection performance of the
detector; and the defect state morphology can be finely controlled by the thermal annealing temperature, annealing time and thickness of the photosensitive layer; in addition, the preparation process of the present invention is simple, the cost is low, and it is easy to realize industrial production.