Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

179 results about "Electron capture" patented technology

Electron capture (K-electron capture, also K-capture, or L-electron capture, L-capture) is a process in which the proton-rich nucleus of an electrically neutral atom absorbs an inner atomic electron, usually from the K or L electron shell. This process thereby changes a nuclear proton to a neutron and simultaneously causes the emission of an electron neutrino.

Method of manufacturing SONOS flash memory device

A method of manufacturing a SONOS flash memory device is disclosed. The disclosed method comprises the steps of forming a lower oxide layer, a tunnel nitride layer, a sacrificial oxide layer, and an insulating layer for a hard mask in sequence on a semiconductor substrate; removing a portion of the insulating layer by an etching process; forming spacers on sidewalls of the insulating layer etched; removing some part of the sacrificial oxide layer and the tunnel nitride layer by an etching process using the insulating layer and the spacers as a mask; removing the insulating layer, the spacers, and the sacrificial oxide layer; removing a portion of the lower oxide layer by an etching process using the tunnel nitride layer etched as a mask; depositing an upper oxide layer and a polysilicon layer in sequence over the resulting structure; and forming a gate having two separate tunnel nitride layer parts by removing some parts of the polysilicon layer, the upper oxide layer, and the tunnel nitride layer in sequence by an etching process. By separating the tunnel nitride layer into two parts, movement of electrons captured in the tunnel nitride layer can be completely prevented. Therefore, the present invention can obviate device malfunction, thereby ensuring device characteristics and reliability.
Owner:DONGBU ELECTRONICS CO LTD

Method capable of simultaneously measuring organochlorine pesticide concentration and synthetic musk concentration in human serum

The invention relates to a method capable of simultaneously measuring organochlorine pesticide concentration and synthetic musk concentration in human serum. According to the method, the aim of measuring organochlorine pesticide and synthetic musk in the serum is realized through a chemical pretreatment method of liquid-liquid extraction, gel permeation chromatography and silica gel alumina column, in combination with a detection technology of gas chromatography-electron capture detection (GC-ECD) and gas chromatography-mass spectrometry (GC-MS). The method provided by the invention belongs to the technical field of physico-chemical analysis measurement of organic chemicals. In the method provided by the invention, the serum pretreatment process comprises organic solvent liquid-liquid extraction, gel permeation chromatographic column degreasing, silica gel alumina column purification, separation and concentrating to constant volume, finally, GC-ECD and GC-MS are used for detection, detection spectrograms of organochlorine pesticide and synthetic musk in serum sample are respectively obtained, and concentration values of organochlorine pesticide and synthetic musk in the serum are calculated through a special formula. The method provided by the invention is a steady, relatively high-sensitivity and high-precision effective measurement method.
Owner:SHANGHAI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products