Unlock instant, AI-driven research and patent intelligence for your innovation.

A detection method for high temperature and long-term luminous flux maintenance rate of LED light source

A technology of LED light source and luminous flux maintenance rate, which is applied in the direction of testing optical performance, etc., can solve the problems of burning out LED light source testing, high cost and energy consumption, and failure to effectively use the heat of LED lighting, so as to eliminate test failures Possibility, reduce test cost and energy consumption, optimize the effect of temperature adjustment method

Active Publication Date: 2017-02-15
浙江中博光电科技有限公司
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the long aging test time (usually about 6000 hours), if an active heat dissipation structure is adopted, such as a refrigerator or a fan for heat dissipation, once the heat dissipation structure stops operating during the test, the temperature in the test chamber will be due to the heat generated by the LED lighting It cannot be discharged, resulting in a sharp rise in Ts, burning out the LED light source and failing the test; and because the active heat dissipation structure needs to be continuously turned to dissipate heat, and the heat generated by the LED lighting has not been effectively utilized, the traditional test chamber per cubic meter The rated power of the equipment needs to be 15kw, and the cost and energy consumption of the whole test process are huge

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A detection method for high temperature and long-term luminous flux maintenance rate of LED light source
  • A detection method for high temperature and long-term luminous flux maintenance rate of LED light source
  • A detection method for high temperature and long-term luminous flux maintenance rate of LED light source

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0050] Such as figure 1 As shown, this embodiment is composed of a test box 1, a power supply controller 2, an LED temperature tester 3, a life tester 4 and a temperature control system 5. The test box 1 is composed of a fixed part 13 and a drawer part 14. The fixed part 13 The test position is uniformly arranged in the drawing part 14, and the heat dissipation plate 11 is arranged on the test position. The fixed part 13 and the drawing part 14 are slidably connected by a guide rail 15, and the guide rail 15 is provided with a bump 151 and a limit hole 152. The protrusion 151 can slide on the guide rail 15 together with the drawing part 14, and can be clamped in the limiting hole 152 to position the fixing part 13 and the drawing part 14. The end surface of the drawing part 14 away from the fixing part 13 A handle 141 is provided, and a control key 153 is provided on the handle 141 , and the control key 153 can control the protrusion height of the protrusion 151 so as to relea...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an LED light source high temperature long term luminous flux maintenance rate detection method. The LED light source high temperature long term luminous flux maintenance rate detection method comprises to-be-detected member mounting, environment temperature adjusting, to-be-detected member aging and luminous flux maintenance rate testing. According to the method, an active heat radiation structure is converted into a passive heat radiation structure, internal temperature of a test box is controlled in a real time by utilizing a temperature control system, a problem of test failure caused by stop of the active heat radiation structure in the prior art is eliminated, reliability of a detection process is improved, moreover, heat generated because of lighting of an LED can be reserved in the test box, heat generated by an LED light source in normal operation is utilized by the temperature control system to carry out heating, operation cost of a heat radiation system is reduced, required operation power is only 1 / 10-1 / 3 of power required through a method in the prior art, and thereby test cost and energy consumption are effectively reduced.

Description

technical field [0001] The invention relates to a method for detecting the service life of an LED light source, in particular to a method for detecting the high temperature and long-term luminous flux maintenance rate of the LED light source. Background technique [0002] Due to the advantages of small size, low power consumption, durability, long service life, safety, low voltage, low heat, and environmental protection, LED is impacting the traditional lighting market. Various countries have also implemented a large number of preferential policies to vigorously promote it. . However, the actual service life of LED lamps has always been the top priority in the industry, and it is also the decisive point in the actual promotion of LEDs; due to the variety of LED lamps and the long life test period (the test time is at least 6000 hours) , If you want to test the life of each model of LED lamps, the cost is quite high. [0003] For this reason, the Illuminating Engineering As...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 蒋卫敏胡旭梁翟莉芳章丹枫
Owner 浙江中博光电科技有限公司