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PCB transmission line insertion loss testing method and probe device

A technology of insertion loss and testing method, which is applied in the direction of measuring device, measuring electrical variable, measuring resistance/reactance/impedance, etc., can solve the problems of complex de-embedding algorithm, affecting calculation accuracy, easy damage, etc., and achieve simple and effective algorithm correction, The effect of improving product reliability and saving labor costs

Active Publication Date: 2015-04-29
INSPUR BEIJING ELECTRONICS INFORMATION IND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0018] From the above introduction, it can be seen that the existing de-embedding algorithm is more complicated, involving matrix transformation and calculation, and the operation process is cumbersome, which affects the calculation accuracy
In addition, the current types of probes include GGB, SMA / SMP, probe stations, etc., which cannot meet the requirements of batch testing in terms of cost, efficiency, and ease of use.
Among them, the GGB probe is used to cooperate with the test method of SET2DIL, which is easy to damage and high in cost
SMA probes are generally used for passive channel testing and have high precision, but require soldering of corresponding interface libraries such as PCB, which is poor in convenience and ease of design
The high-end probe test bench has the characteristics of high precision and high cost. The cycle of testing a single board is about 2 days, and the cost of testing and labor is high, so it cannot be used for mass testing

Method used

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  • PCB transmission line insertion loss testing method and probe device
  • PCB transmission line insertion loss testing method and probe device
  • PCB transmission line insertion loss testing method and probe device

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Experimental program
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Embodiment 1

[0045] Embodiment 1: De-embedding method

[0046] To manufacture the PCB wiring test board involved in the technical solution proposed in this embodiment, hereinafter referred to as the test fixture in the present invention. In the design of the test fixture (test board) proposed in this embodiment, in order to match the probe device, corresponding test probe points are designed. See attached figure 2 , use the Fibonacci Sequence (Fibonacci Sequence) for wiring design, and design PCB transmission lines of different lengths.

[0047] Except for the different lengths, the transmission line design requires the same attributes (layer, cross-sectional area, etc.). For how to choose the specific length of two pairs of differential lines, so as to ensure the accuracy of the de-embedding algorithm, the method is as follows:

[0048] Through the accumulation and comparison of a large number of test and verification data, in order to obtain accurate test data, the difference between...

Embodiment 2

[0073] Embodiment 2: probe device

[0074] Figure 5 The probe device proposed in this embodiment is shown. The probe device (cable bracket pen) comprises two parts: a probe end and a fixed end. The probe end includes a differential probe tip specification and a single-ended probe tip specification. Both specifications of probes include GND pins for connecting PCB GND and test equipment GND. The signal probe is composed of a semi-rigid RF coaxial cable, which can also be replaced by similar materials. One end is an SMA interface, which is connected to the test equipment through a cable cable; the other end is designed for stripping the core of the cable, which is designed for semi-rigid material , so the terminal pin spacing can be adjusted to deal with different test points.

[0075] see Figure 6 , which shows that the fixed end of the probe device is divided into three parts, part1 can be fixed to the automatic arm by screws or buckles or other methods, part3 can use t...

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Abstract

The invention provides a PCB transmission line insertion loss testing method. The method comprises the steps that a specific testing PCB is constructed; de-embedded insertion loss of a transmission line of a specific length under the condition of specific frequency point is counted to serve as a testing empirical value; the testing empirical value is used as a comparison target value used for judging the design quality of an actual PCB. The invention further provides a probe device. The probe device comprises a probe end and a fixed end. The probe device is easy to operate, high in testing accuracy, low in cost and easy to maintain. The method is concise and effective in correction and high in accuracy.

Description

technical field [0001] The invention relates to the technical field of printed circuit board PCB design, in particular to a fully automatic PCB transmission line insertion loss testing method and a probe device. Background technique [0002] Driven by Moore's Law, the electronics industry has become more functional, more integrated, faster and faster, and the corresponding research and development cycle is getting shorter and shorter. Due to the miniaturization and high speed of electronic products, various challenges are brought to design and engineering. PCB is the physical realization of electrical connection. Various electrical devices are connected through PCB to complete the function realization. The PCB contains metal transmission lines that connect various devices. In a high-speed serial system, we also need to consider the high-quality transmission loss and the dielectric loss performance of the insulating environment where the transmission line is located. PCB lo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26
Inventor 王恩东胡雷钧邹定国林楷智李鹏翀张柯柯
Owner INSPUR BEIJING ELECTRONICS INFORMATION IND