Integral liquid crystal module testing device

Abstract

The invention discloses an integral liquid crystal module testing device which comprises an ARM core module, a signal processing module, a power supply module and a signal output and control module, wherein the signal output and control module comprises an MCU sub-module, an FPGA signal processing sub-module, a signal processing conversion chip and a signal output sub-module; the ARM core module is connected with the signal processing module, the power supply module and the signal output and control module respectively; the signal processing module is connected with the signal output and control module; the power supply module and the signal output sub-module are respectively connected with a liquid crystal module to be tested. The operation system and a testing application program operation platform of a host computer are integrated into liquid crystal module testing equipment, liquid crystal module configuration and testing operation can be directly performed without the host computer, and sharing or downloading is not needed; in addition, multiple normal testing signals can be simultaneously compatible in the testing device, so that adapter wires are reduced.

Description

technical field [0001] The invention relates to the field of liquid crystal module testing, in particular to an integrated liquid crystal module testing device that can be separated from a host computer for parameter configuration and testing operations and is compatible with various test signals. Background technique [0002] LCM (LCD Module, liquid crystal module) is the mainstream of flat panel display terminals at present and in the future. On the LCM production line, it is necessary to use the liquid crystal module testing device to test the display quality of the LCM to ensure the quality of the module. [0003] According to different application requirements, LCM needs to adopt different physical signal interfaces, such as LVDS, DP, MIPI, etc. Currently, if figure 1 As shown, the liquid crystal module test device generally consists of a test system composed of a host computer, LVDS signal source and signal interface expansion board (physical interface such as DP, MIP...

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Problems solved by technology

[0004] 1) Modifying the configuration parameters of the LCM to be tested requires the intervention of a specially configured host computer, and it needs to be shared or downloaded to the LVDS signal source through the network port, and the test process is relatively complicated;

[0005] 2) Various wires need to be connected between each device, the operation process is relatively cumbersome, and the test system cannot be moved at will after it is built;

[0006] 3) Since the built test system needs to be connected by various wires, the poor contact of the interface may easily cause misjudgment of the test results;

[0007] 4) The test system built takes up a lot of space

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