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TeraHertz wave line width measurement device and method

A terahertz wave line and width measurement technology, which is applied in the field of terahertz wave detection, can solve problems such as inapplicability, and achieve the effects of convenient operation, simple structure, and low cost

Inactive Publication Date: 2015-05-13
TIANJIN UNIV
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Problems solved by technology

In the terahertz field, the cost of area array cameras is much higher than that of area array cameras in the laser field, so this measurement method is not suitable for direct promotion in the terahertz field

Method used

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  • TeraHertz wave line width measurement device and method
  • TeraHertz wave line width measurement device and method
  • TeraHertz wave line width measurement device and method

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Embodiment Construction

[0037] A realization scheme of a terahertz linewidth measurement device based on a scanning Fabry-Perot interferometer is proposed. This device has a compact structure, low cost and can work at room temperature, and is suitable for terahertz research fields and Practical application fields of terahertz technology.

[0038] The purpose of the present invention is to provide a solution for monochromatic terahertz wave linewidth measurement:

[0039] According to the Airy formula of multi-beam interference, under the condition of not considering the absorption, the power transmittance of Fabry-Perot (FP) interferometer to the wavelength λ is

[0040] T ( d ) = [ 1 + 4 R 2 ( 1 ...

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Abstract

The invention belongs to the technical field of TeraHertz wave detection and discloses a scanning fabry-perot interferometer used for line width measurement at a TeraHertz wave band. According to the technical scheme, TeraHertz wave line width measurement device and method include that incidence TeraHertz wave is emitted to a fabry-perot interferometer endoscope in parallel after passing a first off-axis parabolic mirror plated with gold at the surface; a fabry-perot interferometer endoscope a and a fabry-perot interferometer endoscope b are fixed at positions made of high-resistance silicon material; a stepping mobile platform performs stepping movement along the TeraHertz wave propagation direction; the parallel incidence TeraHertz wave from the endoscope b is gathered through a second off-axis parabolic mirror plated with gold at the surface; the focal position of the second off-axis parabolic mirror plated with gold at the surface is provided with a chopper, the second off-axis parabolic mirror plated with gold at the surface outputs the TeraHertz wave, and the measurement result is output through the chopper, a pyroelectric detector and an AD converter. The TeraHertz wave line width measurement device and method are mainly used for the TeraHertz wave detection.

Description

technical field [0001] The invention belongs to the technical field of terahertz wave detection; in particular, it relates to a device and method for measuring the line width of terahertz waves. technical background [0002] In recent years, many different types of terahertz radiation sources have been greatly developed and widely used in imaging, spectral analysis and other fields. In the field of terahertz spectral analysis, terahertz time-domain spectroscopy technology can no longer meet the actual needs in some applications because it can only achieve spectral resolution of tens of GHz. In this context, a frequency-tunable narrow-linewidth single-frequency terahertz source has been proposed for spectral detection. At present, some single-frequency terahertz radiation sources with narrow linewidth have emerged, such as terahertz radiation sources based on nonlinear difference frequency or parametric oscillation technology, etc. The output linewidth of the narrow-linewid...

Claims

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Application Information

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IPC IPC(8): G01J9/02G01J3/45
Inventor 徐德刚李佳起王与烨李忠孝闫超刘鹏翔石嘉严德贤徐文韬姚建铨
Owner TIANJIN UNIV
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