Nonvolatile SRAM (Static Random Access Memory) storage unit based on RRAM (Resistive Random Access Memory)

A storage unit, non-volatile technology, applied in information storage, static memory, digital storage information, etc., can solve the problems of long operation time and complicated steps, and achieve the effect of saving power consumption and reducing storage operation time.

Inactive Publication Date: 2015-06-17
XI AN UNIIC SEMICON CO LTD
View PDF8 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But various combination in the prior art, the step of execut

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Nonvolatile SRAM (Static Random Access Memory) storage unit based on RRAM (Resistive Random Access Memory)
  • Nonvolatile SRAM (Static Random Access Memory) storage unit based on RRAM (Resistive Random Access Memory)
  • Nonvolatile SRAM (Static Random Access Memory) storage unit based on RRAM (Resistive Random Access Memory)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention will be further described in detail below in conjunction with specific examples, which are explanations of the present invention rather than limitations.

[0022] A kind of non-volatile SRAM storage unit nvSRAM based on RRAM of the present invention, as figure 1 As shown, it includes a traditional 6-transistor SRAM unit 6T-SRAM, and two 1T1RRRAM units, 1T1Rl and 1T1Rr. 6T-SRAM includes 2 N-type access transistors, NAL and NAR, and 4 logic transistors, PL, NL, PR, NR in two cross-coupled inverters. The 1T1R unit includes a resistance variable resistor R and a selection transistor T, the anode of R is connected to the source of T, and R has two states of high resistance state and low resistance state. The 3 ports of the second RRAM unit 1T1Rr, the drain terminal of RNSR, the cathode of RR, and the gate terminal of RNSR are respectively connected with the first bit line BL, the second data line QB and the resistance word line RWL; the 3 ports of the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a nonvolatile SRAM (Static Random Access Memory) storage unit based on RRAM (Resistive Random Access Memory). By adoption of the nonvolatile SRAM storage unit, data can be automatically recovered, the stored data can be maintained still under the condition of power failure, the power consumption of a memory stand-by mode is low and the operation is convenient. The nonvolatile SRAM storage unit comprises a six-transistor SRAM unit 6T-SRAM and two 1T1RRAM unit, wherein the six-transistor SRAM unit 6T-SRAM comprises two N-type accessible transistors and four logic transistors in two cross-coupled inverters; the two ends of the N-type accessible transistors are respectively connected with a data line and a bit line at the same side; the RRAM unit comprises a variable-resistance resistor R and a selective transistor T respectively; the anode of the variable-resistance resistor R is connected with the source end of the selective transistor T, and the variable-resistance resistor R has two states, i.e., high resistance state and low resistance state; and the drain end of the RRAM unit is connected with the bit line at the opposite side, the cathode of the RRAM unit is connected with the data line at the same side, and the grid end of the RRAM unit is connected with a word line of the resistor.

Description

technical field [0001] The invention relates to the field of memory design, in particular to a non-volatile SRAM unit integrated with an RRAM unit. Background technique [0002] With the continuous advancement of process technology, the static power consumption caused by leakage accounts for an increasing proportion of memory power consumption in system-on-chip (SOC), especially for mobile chips, which are very important for power consumption. Also, for code storage and low-capacity data storage chips for many commercial and industrial applications, nonvolatile memory technologies faster than flash and EEPROM are required. [0003] The currently commonly used battery backup SRAM (BBSRAM, Battery Backup SRAM) cannot be applied in mobile SOC and battery-free solutions because it requires a board-level battery or packages the battery and SRAM together. There is also a solution of SRAM combined with embedded FLASH. Due to the limitation of FLASH programming and reading methods,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G11C11/413
CPCG11C14/00
Inventor 韩小炜
Owner XI AN UNIIC SEMICON CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products