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An impact-resistant semiconductor chip packaging structure

A chip packaging structure and semiconductor technology, applied in the direction of semiconductor devices, semiconductor/solid-state device components, electric solid-state devices, etc., can solve problems such as affecting the packaging quality, inability to use, cracking, etc., and achieve the effect of improving strength

Active Publication Date: 2017-11-07
KUNSHAN POLYSTAR ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the processing of this kind of packaging method, the packaged product needs to withstand high temperature and pressure. If the product to be packaged cannot withstand high temperature and high pressure, this kind of solid material packaging method cannot be used.
Using liquid epoxy packaging materials at room temperature, injecting them into molds at low pressure, and using baking to cure can solve the shortcomings of the packaged materials themselves that are not resistant to high temperature and high pressure, but the glass transition temperature of liquid epoxy packaging materials is low. After curing Epoxy packaging materials have low strength and are easily affected by high and low temperature mutations (such as reflow soldering, high and low temperature impact, etc.), and abnormal conditions such as surface protrusions and cracks occur, which affect the packaging quality

Method used

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  • An impact-resistant semiconductor chip packaging structure
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Embodiment Construction

[0014] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0015] Such as figure 1 , figure 2 As shown, an impact-resistant semiconductor chip packaging structure includes a semiconductor chip 1 and a substrate 2, the semiconductor chip 1 is mounted on the substrate 2, and the substrate 2 around the semiconductor chip 1 is provided with foot holes 4, the The foot of the hard copper wire frame 5 is installed in the foot hole 4, and the hard copper wire frame 5 covers the top of the semiconductor chip 1, and the semiconductor chip 1, the substrate 2, the foot hole 4 and the hard copper wire frame 5 are all covered Encapsulation material 6 covers, and described encapsulation material 6 is the mixture of epoxy resin and fiber thread, and the diameter of described fiber thread is 0.5mm, and the single length of described fiber thread is 5mm, and described hard copper wire frame 5 is cuboid The ...

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Abstract

The invention discloses an impact-resistant semiconductor chip packaging structure, which comprises a semiconductor chip and a substrate, the semiconductor chip is installed on the substrate, foot holes are arranged on the substrate around the semiconductor chip, metal The legs of the wire frame, the wire frame is covered above the semiconductor chip, and the semiconductor chip, the substrate, the foot holes and the wire frame are all covered by an encapsulation material, and the encapsulation material is a mixture of epoxy resin and fiber threads , the technical solution of the present invention solves the abnormal situation of surface protrusions and cracks in the case of sudden changes in high and low temperatures, so that the packaged product can withstand the impact of external forces without mechanical damage, making semiconductor components suitable for application Used in harsh impact environments.

Description

technical field [0001] The invention relates to a semiconductor chip packaging structure, in particular to an impact-resistant semiconductor chip packaging structure. technical background [0002] The traditional semiconductor chip packaging method generally uses high temperature and high pressure to melt the solid packaging material at room temperature and inject it into the mold, and then re-cure quickly (5-50 seconds). During the processing of this packaging method, the packaged product needs to withstand high temperature and pressure. If the product to be packaged cannot withstand high temperature and high pressure, this kind of solid material packaging method cannot be used. Using liquid epoxy packaging materials at room temperature, injecting them into molds at low pressure, and using baking to cure can solve the shortcomings of the packaged materials themselves that are not resistant to high temperature and high pressure, but the glass transition temperature of liquid...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/495H01L23/29
Inventor 张小平卢涛
Owner KUNSHAN POLYSTAR ELECTRONICS
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