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Infrared dual-waveband common-aperture refraction and reflection imaging system

An imaging system, dual-band technology, applied in the field of optical applications, to achieve the effect of reducing system size, reducing system weight, and compact structure

Active Publication Date: 2015-07-22
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

"Acta Optica Sinica" reported in the 6th issue of 2013 that Zhang Xinting, An Zhiyong and others designed a double-layer harmonic diffraction dual-band infrared athermalization optical system, using germanium and special AMTIR1 optical materials, and introducing double-layer harmonic diffraction elements to achieve The dual-band and athermal difference design is adopted. This system has the same problem as the infrared dual-color wide-band high-diffraction efficiency diffractive optical system.

Method used

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Embodiment Construction

[0018] Such as figure 1 As shown, the present invention proposes an infrared dual-band common-aperture catadioptric imaging system. In order to reduce the weight of the system and reduce the volume of the system, the infrared dual-band common-aperture catadioptric imaging system shares four optical components, namely the main mirror 1 , secondary mirror 2, collimating mirror 1, collimating mirror 2, beam splitter 5 is a lens placed obliquely at 45 degrees, infrared dual-band splitting is realized by coating the front surface of beam splitter 5, long-wave correction mirror 1, long-wave correction mirror 2 , the long-wave correction mirror 3, the long-wave correction mirror 4, and the long-wave correction mirror 5 are used to correct the residual aberration in the long-wave infrared band after the correction of the shared components in the long-wave infrared branch, and the optical filter 7 is used to filter out the spectrum of unnecessary bands , MW correction mirror 1, MW corr...

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Abstract

The invention discloses an infrared dual-waveband common-aperture refraction and reflection imaging system which is used for imaging target radiation of medium-wave spectral wavebands and long-wave spectral wavebands at infinite positions on a long-wave infrared detector and a medium-wave infrared detector. The infrared dual-waveband common-aperture refraction and reflection imaging system is characterized in that a main optical path is a long-wave infrared optical path, a reflex optical path is a medium-wave infrared optical path, the main optical path comprises a primary mirror, a secondary mirror, a first collimating mirror, a second collimating mirror, a beam splitter mirror, a first long-wave correcting mirror, an optical filter, a second long-wave correcting mirror, a third long-wave correcting mirror, a fourth long-wave correcting mirror, a fifth long-wave correcting mirror and a long-wave detector assembly which are sequentially arranged from a beam incidence direction, and the reflex optical path comprises the primary mirror, the secondary mirror, the first collimating mirror, the second collimating mirror, the beam splitter mirror, a first medium-wave correcting mirror, a second medium-wave correcting mirror, a third medium-wave correcting mirror, a medium-wave turning reflecting mirror, a fourth medium-wave correcting mirror, a fifth medium-wave correcting mirror and a medium-wave detector assembly. The infrared dual-waveband common-aperture refraction and reflection imaging system has the advantages of relatively compact structure, light weight, good imaging quality, capability of working in wide temperature ranges, and the like.

Description

technical field [0001] The invention relates to an infrared dual-band common-aperture catadioptric imaging system, which belongs to the field of optical applications. Background technique [0002] The infrared detection system detects and identifies the target by detecting the infrared radiation characteristics of the target. It has the advantages of passive detection, strong concealment, strong anti-interference, and can realize all-weather detection and search. Under adverse meteorological conditions such as poor visibility, it can penetrate the above-mentioned meteorological restrictions and identify and detect targets. At present, the most commonly used infrared detection systems are medium-wave infrared detection systems and long-wave infrared detection systems. Both have their own advantages. The infrared detection system has a higher transmittance in hot and humid atmospheric environments, while the long-wave infrared detection system has a higher transmittance in lan...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B17/08
CPCG02B17/0812
Inventor 白瑜廖志远任栖峰廖胜陈为谭述亮林妩媚邢廷文
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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