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Testing device, testing method and display system

A test device and display system technology, applied to static indicators, detecting faulty computer hardware, instruments, etc., can solve the problems of data processing, operation speed lagging, waste of resources, etc., and achieve data processing and operation speed improvement, improve The effect of utilization

Active Publication Date: 2015-09-02
KUSN INFOVISION OPTOELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the data processing and operation speed of ARM is far behind Field Programmable Gate Array (Field-Programmable Gate Array, FPGA), and the use of ARM chips for the current liquid crystal display field, most of its functions have not been used. Definitely a waste of resources

Method used

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  • Testing device, testing method and display system
  • Testing device, testing method and display system
  • Testing device, testing method and display system

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Embodiment Construction

[0022] In order to further illustrate the technical means and effects that the present invention takes to achieve the intended purpose of the invention, below in conjunction with the accompanying drawings and preferred embodiments, the specific implementation methods, methods, Steps, structure, features and effects are described in detail below.

[0023] The foregoing and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of preferred embodiments with reference to the drawings. Through the description of specific implementation methods, the technical means and effects of the present invention to achieve the intended purpose can be understood more deeply and specifically, but the attached drawings are only for reference and description, and are not used to explain the present invention limit.

[0024] see figure 1 , figure 1 It is a schematic diagram of a module of a testing device according...

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Abstract

The invention discloses a testing device, a testing method and a display system. The testing device comprises a secure digital card, a field-programmable gate array and a storage unit; the secure digital card is used for storing code data; the field-programmable gate array is connected with the secure digital card and used for reading the code data stored in the secure digital card and compressing the code data; the storage unit is connected with the field-programmable gate array and used for caching the code data compressed by the field-programmable gate array, and the storage unit comprises a plurality of storages; the field-programmable gate array is further used for calling the compressed code data cached in the storages, and decompressing and decoding the compressed code data to output test signals. The testing device, display system and testing method use the field-programmable gate array to compress the code data, the data processing and computing speed is fast, and the data transmission efficiency and the processor use ratio are improved.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display, in particular to a test device, a display system using the test device and a test method. Background technique [0002] With the rapid development of display technology, liquid crystal display (Liquid Crystal Display, LCD) technology has emerged, and it is widely used in various fields, such as mobile phones, computers, and other various devices and instruments that require display. [0003] At present, most of the existing LCD module picture display test devices with a resolution below 2k, that is, 2560*1440, use Advanced RISC Machines (ARM) as driver chips. Because the ARM chip integrates modules such as liquid crystal display and picture decoding, which greatly simplifies the complexity of programming, the use of ARM as a display driver chip for LCD modules is welcomed by most people. However, the data processing and operation speed of ARM is far behind Field Programmable Gate ...

Claims

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Application Information

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IPC IPC(8): G06F11/22G06F13/16G09G3/00
Inventor 狄磊磊
Owner KUSN INFOVISION OPTOELECTRONICS