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Device and method for measuring cross-sectional images of pulsed ion beams

A pulsed ion beam and cross-sectional image technology, applied in the field of accelerators, can solve the problems of high repetition times, high ion beam current intensity, and poor accuracy of cross-sectional images, etc., and achieve the effect of simple equipment materials, easy preparation, and easy purchase

Inactive Publication Date: 2018-05-25
INST OF NUCLEAR PHYSICS & CHEM CHINA ACADEMY OF
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] At present, all methods for measuring and observing the size and shape of the pulsed ion beam spot have obvious deficiencies: the focal spot observation method requires a large number of ion beams to bombard metal materials to produce burnt and dead etching marks, forming the so-called focal spot
This method requires high ion beam intensity and many repetitions, so it is not suitable for the observation of pulsed ion beams, especially single pulsed ions; the beam current measurement method on the aperture and on the target needs to measure the pulsed ions on the target and the aperture respectively. Current, this method takes a long time to measure, and can only obtain the distribution of pulsed ion beams. The visible light of the fluorescent target will also produce a response, so the accuracy of the cross-sectional image is poor

Method used

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  • Device and method for measuring cross-sectional images of pulsed ion beams

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Embodiment 1

[0023] figure 1 Is a schematic diagram of the structure of the present invention, in figure 1 Among them, the pulse ion beam cross-sectional image measurement device of the present invention includes 1. ion source, 2. quartz glass tube, 3. imaging plate, 4. aluminum backing plate, 5. pitch screw, 6. pitch nut, 7. Stainless steel flange, 8. Adjustable acceleration power supply, 9. Vacuum unit, 10. Imaging analyzer, 11. Ion source pulse power supply, 12. Isolation transformer.

[0024] Set an aluminum backing plate 4 at the target position of the pulsed ion beam cross-sectional image measurement device, and fix the imaging plate 3 on the aluminum backing plate 4, the plate surface is perpendicular to the running direction of the pulsed ion beam; turn on and adjust the high voltage value of the acceleration power supply 8 to 30kV; the vacuum degree of the quartz glass tube 2 in the measuring device is pumped to 5×10 by the vacuum unit 9 -4 Pa, adjust the output pulse of the ion sou...

Embodiment 2

[0026] This embodiment has the same structure as embodiment 1, and the implementation process is the same. The difference is: adjust the high voltage value of the acceleration power supply 8 to 120kV; set the output pulse repetition frequency of the ion source pulse power supply 10 to 0.1 Hz; 10 Start to start timing, and the measurement time is 20s.

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Abstract

The invention provides a measuring device and method for a pulsed ion beam cross section image, and especially provides a measuring device and method for a pulsed ion beam cross section image with a continuous adjustable acceleration voltage, and with a single pulse or an adjustable pulse frequency. An imaging plate is installed in a target position of the measuring device. High vacuum inside the measuring device is achieved by utilization of a vacuum unit. When the pulse ion source of the measuring device discharges, a cathode material is ionized, and plasma is generated. When a high-voltage pulse is applied at a guiding-out electrode, a pulse ion beam is guided out and hits on the imaging plate. After the imaging plate receives the pulse ion beam, a sensitive layer is excited and carries the ion beam distribution latent image. After the imaging plate is taken out from the pulse ion beam cross section image measuring device, an imaging analyzer releases hard light and thus de-excitation of the sensitive layer is carried out, the latent image is converted into an optical image, then the optical image is converted into a digital image, and then the digital image is transmitted to a computer. The shape of the image can be observed conveniently, and transverse dimension and vertical dimension of a beam spot can be measured quantificationally.

Description

Technical field [0001] The invention belongs to the technical field of accelerators, and specifically relates to a device and method for measuring pulsed ion beam cross-sectional images, in particular to a device and method for measuring pulsed ion beam cross-sectional images with adjustable acceleration voltage, single pulse or adjustable pulse frequency. Background technique [0002] Pulse accelerators have a wide range of applications in the field of nuclear technology. Pulsed neutron tubes have very important applications in the field of non-destructive testing and pulsed neutron logging. The working principle of the pulse accelerator and pulse neutron tube is that pulsed deuterium ions are generated by the discharge of the pulsed ion source. The pulsed deuterium ions are accelerated by the accelerating electrode and hit the tritium target to form a deuterium-tritium fusion reaction to generate 14MeV pulsed neutrons. After the pulsed ion beam is drawn from the ion source, pa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T3/00
Inventor 周长庚柯建林邱瑞
Owner INST OF NUCLEAR PHYSICS & CHEM CHINA ACADEMY OF
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