A method of ground-based lunar observation using a slit-type imaging spectrometer
An imaging spectrometer and imager technology, which is applied in spectrum investigation and other directions, can solve the problems of extremely high tracking and positioning accuracy and the inability to obtain high spectral resolution, and achieve the effect of overcoming the extremely high tracking accuracy and improving observation efficiency
Active Publication Date: 2017-03-01
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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[0004] In order to solve the problems existing in the existing ground-based moon observation methods that require extremely high tracking and positioning accuracy and cannot obtain high-resolution lunar continuous spectrum images, the present invention provides a ground-based moon observation method using a slit-type imaging spectrometer method
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[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0027] like figure 2 As shown, the method of utilizing the slit-type imaging spectrometer of the present invention to carry out ground-based observation of the moon is mainly realized through the following steps:
[0028] Step 1: In the method of the present invention, the ground-based lunar observation device adopted is such as figure 1 As shown, it is mainly composed of a tracking and positioning two-dimensional turntable 1, a slit imaging spectrometer 2, a lunar imager 3, and a computer control and acquisition system 4. Both the slit imaging spectrometer 2 and the lunar imager 3 are installed on the tracking and positioning two-dimensional turntable 1, and the slit imaging spectrometer 2 and the lunar imager 3 are installed on the same optical axis; the slit imaging spectrometer 2 and the lunar imager 3 All are electrically connected with the computer c...
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The method of ground-based lunar observation using a slit-type imaging spectrometer belongs to the field of ground-based lunar observation, and solves the problem of the existing ground-based lunar observation method that requires extremely high tracking and positioning accuracy and cannot obtain high spectral resolution. The continuous spectrum of the moon Image problem. The method is as follows: obtain the moon’s trajectory and angular velocity according to the moon’s trajectory simulation software, point the slit-type imaging spectrometer to the edge of the moon, fix it, and continuously collect lunar spectral images. After the field of view of the slit imaging spectrometer, the lunar spectral image detection is carried out, and a series of lunar strip spectral images obtained are spliced to obtain the entire lunar spectral image information. The invention uses a low-precision tracking and positioning two-dimensional turntable to fix the slit-type imaging spectrometer to a certain position, overcomes the problem of extremely high tracking accuracy in the existing method, and finally can obtain a continuous spectrum image of the moon with high spectral resolution.
Description
technical field [0001] The invention belongs to the technical field of ground-based lunar observation, and in particular relates to a method for ground-based lunar observation by using a slit-type imaging spectrometer. Background technique [0002] One of the challenges of quantitative spatial remote sensing absolute measurement (the measured quantity can be directly read from the instrument) is to monitor the change of the instrument response for a long time, and comparing it with the standard source is a way to monitor the change. If a natural star with known radiation properties is available, it is a very valuable calibration source. The moon is the only natural star that is included in the dynamic range of most imaging spectrometers in Earth orbit. It is called "solar diffuser" and is very stable. The surface of the moon has excellent radiation stability. Once the lunar spectral radiation is accurately determined The variation of brightness with phase angle and libratio...
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IPC IPC(8): G01J3/28
Inventor 王淑荣胡秀清李占峰黄煜
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI