A test probe and test device

A technology for testing probes and test terminals, which is applied in the direction of measuring devices, measuring electricity, and measuring electrical variables. It can solve problems such as test result errors, sample surface scratches and damage, and test probe wear, so as to achieve reduced friction, good contact, The effect of reducing scratch damage as well as
CN105092908BInactive Publication Date: 2017-11-14HEFEI BOE OPTOELECTRONICS TECH +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
HEFEI BOE OPTOELECTRONICS TECH
Publication Date
2017-11-14
Estimated Expiration
Not applicable · inactive patent

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Abstract

Embodiments of the present invention provide a test probe and a test device, which relate to the field of display technology and are used to ensure good contact between the test probe and the surface of the test sample, while reducing the damage of the test probe to the surface of the test sample and the damage of the test probe. wear and tear. The test probe includes: a housing, a piston, an elastic device and a sphere; the housing includes a test end and a fixed end, and the test end is provided with a test opening; the piston can slide between the test end and the fixed end along the inner wall of the housing, and the piston and the fixed end The fixed end of the housing forms a conductive colloid cavity, and the conductive colloid can overflow from the gap between the piston and the inner wall of the housing by squeezing the piston; the first end of the elastic device is fixed on the piston, and the second end of the elastic device extends toward the test end The sphere is arranged at the test opening, the sphere can rotate in the test opening and the size of the test opening is smaller than the diameter of the sphere; the sphere and the second end of the elastic device are separated by a preset distance. Embodiments of the present invention are used for the detection of test samples.
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Description

technical field

[0001] The invention relates to the technical field of displays, in particular to a test probe and a test device. Background technique

[0002] With the development of display technology, liquid crystal display (English full name: Thin Film Transistor-Liquid Crystal Display, abbreviation: TFT-LCD) has been widely used in the display field. For liquid crystal displays, the quality of the array substrate has a crucial impact on the final display effect, so in the process of manufacturing liquid crystal display panels, the detection of the array substrate is a very important link.

[0003] In the inspection process of array substrates, test probes are widely used. The test probe widely used in the prior art is a conductive probe with a simple metal needle-like structure. When testing the array substrate, the test probe is first brought into contact with the surface of the test sample, and then the test signal is applied to the test probe. , and transmit the te...

Claims

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