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Solar cell capacitance time domain testing device and testing method

A technology for solar cells and testing devices, applied in the field of solar cells, can solve problems such as expensive and complex data processing, and achieve the effects of high accuracy, wide application and reliable guarantee

Active Publication Date: 2018-08-14
中电科蓝天科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this test method uses expensive equipment such as network analyzers, and the data processing is quite complicated. It needs to be integrated and iterated multiple times in the frequency domain, and the data needs to be corrected multiple times.

Method used

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  • Solar cell capacitance time domain testing device and testing method
  • Solar cell capacitance time domain testing device and testing method
  • Solar cell capacitance time domain testing device and testing method

Examples

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Embodiment Construction

[0035] In order to further understand the invention content, characteristics and effects of the present invention, the following examples are given, and detailed descriptions are as follows in conjunction with the accompanying drawings:

[0036] refer to figure 1 , figure 2 , image 3 and Figure 4 , a solar cell capacitance time domain testing device, comprising:

[0037] DC power supply, the voltage adjustment range of the DC power supply is 0V ~ 20V;

[0038] A pulse generating circuit, the control terminal Port1 of the pulse generating circuit is electrically connected to the gate of the field effect transistor Q, the pulse generating circuit is used to control the switch driving the field effect transistor Q, and simultaneously control the switch of the switch control circuit;

[0039] A field effect transistor Q, the field effect transistor Q is used for a discharge path when the solar cell is saturated;

[0040]A switch control circuit, the switch control circuit ...

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PUM

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Abstract

The invention discloses a solar battery capacitor time domain testing device and testing method. The solar battery capacitor time domain testing device comprises a direct current power supply, a pulse generating circuit, a field effect tube, a switching control circuit and a resistor to be detected. The testing device controls the complementary starting of the field effect tube and the switching control circuit mainly through the pulse generating circuit; when the switching control circuit is started, the direct current power supply charges a solar battery capacitor; and when the switching control circuit is closed, the charged solar battery capacitor is discharged through the resistor to be detected and the field effect tube, the discharge current of the resistor to be detected is monitored through a first oscilloscope connected in parallel with the resistor to be detected, and the discharge voltage of a solar battery is monitored through a second oscilloscope connected in parallel with the solar battery, thereby obtaining an equivalent capacitor of the solar battery by virtue of calculation. The testing method has the advantages of simple hardware structure, high efficiency and high accuracy and can be used for testing spatial single solar batteries or satellite solar battery arrays.

Description

technical field [0001] The invention relates to the technical field of solar cells, in particular to a solar cell capacitance time-domain testing device and testing method. Background technique [0002] For the current field of communication satellites, the main energy comes from solar cells, and the dynamic parameters of the capacitance of solar cells are one of the important parameters for designing a reliable and effective space solar cell array. Understanding the capacitive dynamic behavior of solar cells is necessary for designing the switching capability of solar arrays in space and the reliability of regulating controllers. It directly affects the interface compatibility of power controllers in space solar arrays. [0003] The solar cell is an active device, its own capacitance is constantly changing with the light and external voltage, and its capacitance is a dynamic nonlinear capacitance, which cannot be used for general test equipment such as LRC tester or multim...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/36
Inventor 邹世纯薛梅鲍伟丰崔新宇
Owner 中电科蓝天科技股份有限公司
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