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Method and apparatus for eliminating nonuniformity of infrared detector in full-temperature response scope

A technology of infrared detector and response range, which is applied in the direction of measuring device, electric radiation detector, radiation pyrometry, etc., and can solve the problem of non-uniform correction of the response temperature section of the infrared detector.

Active Publication Date: 2016-03-02
LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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Problems solved by technology

[0003] The purpose of the present invention is to provide a method for eliminating the non-uniformity of the infrared detector in the full temperature response range, so as to solve the problem that the traditional non-uniform correction method cannot correct the non-uniformity of the response temperature section of the entire infrared detector

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  • Method and apparatus for eliminating nonuniformity of infrared detector in full-temperature response scope
  • Method and apparatus for eliminating nonuniformity of infrared detector in full-temperature response scope
  • Method and apparatus for eliminating nonuniformity of infrared detector in full-temperature response scope

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Embodiment Construction

[0037] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0038] method embodiment

[0039] The method for eliminating the non-uniformity of the infrared detector in the full temperature response range provided by the present invention is based on an infrared detector non-uniformity correction system, the correction system is composed of an imaging component composed of a 640×512 mid-wave infrared detector with a row and column size And infrared low temperature black body construction. The method of using the correction system to eliminate the non-uniformity, that is, the non-uniform correction method specifically has the following steps:

[0040] (1) Under the fixed integration time of the infrared detector, the approximate linear response temperature difference ΔT and the full temperature response range T of the detector are measured 1 ~T 2 .

[0041] (2), according to the approximate linear response temperatu...

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Abstract

The invention relates to a method and apparatus for eliminating nonuniformity of an infrared detector in a full-temperature response scope. The method comprises the following steps: first of all, calculating a non-uniform correction coefficient corresponding to the detector; and then, according to the corresponding non-uniform correction coefficient, carrying out non-uniform correction on the detector. According to the invention, through performing multistage non-uniform correction on the infrared detector, by use of a real-time seamless switching technology between non-uniform correction coefficients at stages, the nonuniformity of the detector in the full-temperature response scope is effectively improved, while the system imaging quality and the detection performance are improved, the operation complexity of the system is not changed, and the engineering practicality and the application flexibility are also quite good. The method can be applied to various infrared imaging systems and detection systems.

Description

technical field [0001] The invention relates to a method and a device for eliminating non-uniformity of an infrared detector in the full temperature response range. Background technique [0002] Since the response of the infrared detector exhibits strong nonlinearity in a wide temperature range, it is impossible to perform non-uniform correction for the response temperature range of the entire infrared detector. The traditional non-uniform correction method intercepts an approximately linear interval of the detector response for non-uniform correction, and in the response temperature section outside this interval, the non-uniformity of the detector will become worse, and it cannot guarantee that the infrared detector will respond in the full-temperature response section. All have good non-uniformity. Contents of the invention [0003] The purpose of the present invention is to provide a method for eliminating the non-uniformity of the infrared detector within the full tem...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/10G01J5/06
Inventor 孙小亮李玉岩潘晓东汪江华
Owner LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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