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1553B test signal monitoring module and 1553B test signal monitoring method for automatic missile test

A technology for automatic testing and testing of signals. It is applied in the direction of using digital measurement technology to measure, measure devices, and measure electrical variables. It can solve the problem that the signal monitoring module cannot effectively record the whole process of testing the signal under test by the test equipment, and achieve rapid positioning. Effect

Inactive Publication Date: 2016-03-30
BEIJING INST OF ELECTRONICS SYST ENG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem that the signal monitoring module of the missile cannot effectively record the whole process of the tested signal of the test equipment, and propose a 1553B test signal monitoring module and monitoring method for automatic missile testing

Method used

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  • 1553B test signal monitoring module and 1553B test signal monitoring method for automatic missile test
  • 1553B test signal monitoring module and 1553B test signal monitoring method for automatic missile test
  • 1553B test signal monitoring module and 1553B test signal monitoring method for automatic missile test

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specific Embodiment approach 1

[0025] Specific implementation mode one: combine figure 1 and Figure 4 Explain that this is an implementation mode. The 1553B test signal monitoring module for missile automatic testing described in this implementation mode includes a voltage conditioning circuit 1, A / D acquisition unit 2, FPGA3, DDR memory 5, CF card 7 and 1553B communication Surveillance unit 6;

[0026] The voltage conditioning circuit 1 is used to collect 16 voltage signals on the monitored path between the device under test and the test system, filter the collected 16 voltage signals, and output 16 voltage analog signals;

[0027] The A / D acquisition unit 2 is used to continuously collect 16 voltage analog signals, and output 16 voltage digital signals after performing analog / digital conversion on the collected 16 voltage analog signals;

[0028] 1553B communication monitoring unit 6, used to collect data signals on the 1153B bus between the device under test and the test system, and send them;

[002...

specific Embodiment approach 2

[0049] Specific implementation mode two: combination figure 2 Describe this embodiment, this embodiment is the 1553B test signal monitoring module that is used for missile automatic test described in specific embodiment 1 to further illustrate, in this embodiment, voltage conditioning circuit 1 includes signal conditioning circuit 1-1 and range Select circuit 1-2;

[0050] The range selection circuit 1-2 is used to select 16 voltage signals collected on the monitored path between the device under test and the test system according to the switch control signal;

[0051] The signal conditioning circuit 1-1 is used to receive the selected 16 voltage signals, filter the selected 16 voltage signals, and send the filtered 16 voltage analog signals.

[0052] The A / D acquisition unit 2 includes a magnetoelectric isolator 2-1, a serial-to-parallel converter 2-2 and an analog-to-digital converter 2-3;

[0053] Analog-to-digital converter 2-3, used to receive 16 channels of voltage an...

specific Embodiment approach 3

[0059] Specific implementation mode three: combination image 3 Describe this embodiment, this embodiment is to further explain the 1553B test signal monitoring module used for missile automatic testing described in the specific embodiment one, in this embodiment, the 1553B communication monitoring unit 9 includes No. 1 controller 9-1 and transformer 9-2;

[0060] The No. 1 controller 9-1 is used to store the 1553B bus data signal; the FPGA3 obtains the data signal stored on the 1553B bus inside the No. 1 controller 9-1 in an interrupt-triggered manner;

[0061] The transformer 9-2 is used to extend the length of the access cable;

[0062] The coil turns ratio of the transformer 9-2 is 1:1.79;

[0063] The model of the No. 1 controller 9-1 is B61580; the model of the transformer 9-2 is B3067.

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Abstract

A 1553B test signal monitoring module and a 1553B test signal monitoring method for automatic missile test belongs to the field of test and signal monitoring. The invention aims to solve the problem that a signal monitoring module of a missile cannot effectively record the whole process in which a test device tests a tested signal. A voltage regulation circuit is adopted to collect 16 voltage signals on a monitored path between a tested device and a test system, a 1553B communication monitoring unit is adopted to collect and store data signals on a 1553B bus, an FPGA is adopted to process the data of the 16 voltage digital signals and the data signals on the 1553B bus, and the voltage signals and the data signals after restructuring are stored in a DDR memory in the powering-on period and stored in a CF card in the powering-off period. The beneficial effect is that the 1553B communication monitoring unit is adopted to monitor the sampling result in real time and store the sampling result and the monitoring result, the results are not lost even under power failure, and the module and the method are applicable to an automatic missile monitoring system.

Description

technical field [0001] The invention relates to a 1553B test signal monitoring module and a monitoring method for missile automatic testing, belonging to the field of testing and signal monitoring. Background technique [0002] With the development of missile automatic test technology, the traditional manual and semi-automatic test has been transformed into automatic test, and the automatic test system has also experienced the development from VXI bus to more compact PXI bus and distributed network bus. [0003] The automatic test system has greatly improved the test speed and execution efficiency. However, for very important objects under test such as missiles, it is necessary to ensure that the test system is always in a normal and correct working state during the test process, so as not to cause damage to the object under test. damage or adverse effects. In the process of actually constructing the missile automatic test system, the missile simulator is often used. Before...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/25
CPCG01R19/2503
Inventor 邵云峰赵明程鹏王晓龙周建宝
Owner BEIJING INST OF ELECTRONICS SYST ENG
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