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Testing method for testing laser diode performance

A technology of a laser diode and a detection method, which is applied in the direction of testing optical properties and the like, can solve the problems of long time consumption, cumbersome and troublesome detection methods, and high detection cost, and achieve the effects of short time consumption, favorable for popularization and use, and low detection cost.

Active Publication Date: 2018-03-06
APAT OPTOELECTRONICS COMPONENTS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to overcome the defects of the prior art and provide a detection method for detecting the performance of laser diodes to solve the problems of cumbersome, time-consuming and high detection cost in the detection method in the prior art

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  • Testing method for testing laser diode performance
  • Testing method for testing laser diode performance
  • Testing method for testing laser diode performance

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Embodiment Construction

[0037] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0038] see figure 1 , the embodiment of the detection method for detecting the performance of the laser diode of the present invention will be described below.

[0039] The detection method for detecting the performance of the laser diode of the present embodiment comprises the following steps:

[0040] S101. Prepare an installation platform 10 for component installation, a laser diode pose adjustment assembly 20 for adjusting the pose of the laser diode, a laser diode holder 30 for clamping and fixing the laser diode, and a laser diode holder for adjusting the photodiode position. The photodi...

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Abstract

Provided is a method for detecting the performance of a laser diode. The method is based on an apparatus composed of an installing platform, a laser diode position and pose adjusting assembly, a laser diode clamp, a photodiode position and pose adjusting assembly, a photodiode clamp, a computer, and a control device. When the performance of the laser diode is required to be detected, the laser diode is clamped by the laser diode clamp and the photodiode is clamped by the photodiode clamp; the distance between the photodiode and the laser diode is adjusted by the photodiode position and pose adjusting assembly; the rotary angle of the laser diode is adjusted by the laser diode position and pose adjusting assembly; further, the computer receives a detected optical power signal, transmitted from the photodiode, of the laser diode and information of the rotary angle of the laser diode acquired by the control device, draws a corresponding curve, and derives a deviation angle and a divergence angle by means of a drawing algorithm so as to obtain a performance result of the laser diode.

Description

technical field [0001] The invention relates to the technical field of detection equipment, in particular to a detection method for detecting the performance of a laser diode. Background technique [0002] In the optoelectronic device industry, one of the key components is a semiconductor laser, which is also called a laser diode (LD, Laser Diode). When problems occur in optoelectronic devices, testing and analyzing the performance of semiconductor lasers can become the primary breakthrough point to solve the problem, and equipment for analyzing LD performance has also been developed. At present, most of the equipment for analyzing LD performance uses industrial CCD (charge-coupled device) for focus capture, and then uses complex algorithms to obtain analysis results. When this type of equipment for analyzing LD performance is relatively expensive, it is not conducive to popularization and use. Moreover, Its detection operation is cumbersome, time-consuming and costly. [...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 杨家安
Owner APAT OPTOELECTRONICS COMPONENTS