Method for measuring conductivity of graphene film based on terahertz time-domain spectroscopy
A technology of graphene thin film and spectral technology, which is applied in the field of measuring graphene thin film conductance based on terahertz spectral technology, which can solve the problems of cumbersome operation, material contact damage, and low rate
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[0028] The graphene film layer claimed in this patent is used to explain the present invention, rather than to limit the present invention. The detection method based on terahertz time-domain spectroscopy is not limited to graphene, and can also be other semiconductor film layers. It only requires The thickness of the film layer is much smaller than that of the base layer.
[0029] The method of the present invention includes the following steps: S1: adjust and obtain the optical path of the terahertz time-domain spectrum system suitable for measuring thin films; S2: measure and obtain the terahertz time-domain spectrum signal of the substrate material; S3: measure and obtain the substrate after transferring the graphene film The material terahertz time-domain spectrum signal of the material; S4: According to the signals collected in S2 and S3, use the formula to calculate the conductance of graphene in the terahertz band; S5: Establish the conductance obtained by terahertz spe...
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