A system and method for judging the reliability of LED devices based on electrical characteristics

A technology of LED devices and electrical characteristics, which is applied in the system field of judging the reliability of LED devices based on electrical characteristics, can solve problems such as chip packaging and phosphor area failure, and achieve the effect of improving product quality and key processes

Active Publication Date: 2018-10-19
漳州市卓富成智能科技有限公司
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, many studies have confirmed that the aging process of light-emitting diodes (LEDs) will lead to failure of chips, packages, and phosphor areas.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A system and method for judging the reliability of LED devices based on electrical characteristics
  • A system and method for judging the reliability of LED devices based on electrical characteristics
  • A system and method for judging the reliability of LED devices based on electrical characteristics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] Such as figure 1As shown, a system for judging the reliability of LED devices based on electrical characteristics disclosed in the present invention includes a standard LED sample, an LED device to be tested, more than two radiators, an LCR acquisition module, a photoelectric detection module and a control processing module; The standard LED sample and the LED device to be tested are respectively fixed on a heat sink, the input ends of the LCR acquisition module are respectively connected to the standard LED sample and the LED device to be tested, and the input ends of the photoelectric detection module are respectively connected to the standard LED sample and the LED device to be tested. For the LED device to be tested, the output end of the LCR acquisition module and the output end of the photoelectric detection module are respectively connected to the input end of the control processing module; the LCR acquisition module collects the electrical signals of the standard...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the technical field of semiconductors, particularly to a system and method for judging LED device reliability based on electrical properties. An LCR collection module collects electrical signals of a standard LED sample and an LED device to be tested under different loads, a photoelectric detection module collects optical signals of the standard LED sample and the LED device to be tested under different loads, a control processing module receives the electrical signals and optical signals, and establishes quantitative relations between light intensity, load voltage, conductance, capacitance and carrier concentration of the standard LED sample and the LED device to be tested according to specific mathematical models, thereby obtaining optical properties of the standard LED sample and the LED device to be tested respectively, and the optical properties of the standard LED sample and the LED device to be tested are compared to judge reliability of the LED device to be tested. The system and method for judging LED device reliability based on electrical properties can rapidly and accurately evaluate the reliability of an LED product, and facilitates improvement of a key technology in an LED manufacturing process so as to improve product quality.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a system and method for judging the reliability of LED devices based on electrical characteristics. Background technique [0002] Compared with ordinary light sources, Light Emitting Diodes (Light Emitting Diodes, referred to as LEDs) have the characteristics of power saving, long life, high luminous efficiency, no radiation, and no pollution, and have been widely used in lighting and other fields. At present, many studies have confirmed that the aging process of light-emitting diodes (LEDs) will lead to failure of chips, packages, and phosphor areas. LED aging test conditions generally apply electrical stress and thermal stress. Due to the difference in thermal expansion coefficient of different materials and the growth of defects, the LED luminous flux attenuates. The main aging mechanism includes dark spot defects, metal alloy migration, composition changes, etc. At pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R31/44
CPCG01R31/2642G01R31/44
Inventor 陈焕庭何仲全陈建顺杨伟艺张志鹏
Owner 漳州市卓富成智能科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap