sram neutron single event effect test control method and device

Abstract

The invention relates to an SRAM neutron single event effect test control method which includes the following steps: (S1) setting and calculating a plurality of control parameters of a device; and (S2) controlling the device under the constraint condition of combination of the control parameters which have been set and calculated. The method definitely sets the parameter conditions which should be controlled in the test and the control methods for constraining the parameters, and also optimizes and provides a complete theoretical method of test process control, thereby ensuring accuracy of a test result and laying a foundation for system reliability researching of an aviation / aerospace system in space environment. The invention also discloses an SRAM neutron single event effect test control apparatus.

Description

technical field [0001] The invention relates to the technical field of automatic control, in particular to a control method and device for a SRAM neutron single event effect test. Background technique [0002] At present, in order to study the sensitive characteristics of SRAM, neutrons with 14 MeV energy are used instead of neutrons in the actual space environment to conduct irradiation tests on SRAM in China. During the test, how to control the test parameters, restrict the test conditions, and ensure the accuracy of the test results has become an important prerequisite for effective research. At present, domestic research on single event effects is still in the preliminary stage, and a complete control system for the accuracy of test results has not been established. Therefore, starting from the determination of the test parameters and the control method, a set of test process control theory has been developed, which can ensure the correctness of the test results and lay...

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Problems solved by technology

However, in the simulation experiment at this stage, we only conduct irradiation tests on some sensitive functional blocks on one or several sensitive devices on the equipment, and do not fully consider the harm that all sensitive functional blocks can cause; On the other hand, during the irradiation test, the total number of device bits B was not strictly discussed, the error number N, the control method of the cumulative fluence F were not given, and the test cut-off condition N end , F end Carry out theoretical analysis, which will lead to insufficient standardization of test procedures, which will affect the accuracy of test results

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