A measuring apparatus for nanometer magnetic materials and a method thereof

A nano-magnetic material and measurement device technology, applied in the field of measurement, can solve problems such as measurement accuracy below 10nm, inability to observe weakly magnetic samples, and harsh experimental conditions, so as to improve detection accuracy and sensitivity, enhance magnetic interaction, and achieve universal strong effect
CN105699705AActive Publication Date: 2016-06-22SUN YAT SEN UNIV
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
SUN YAT SEN UNIV
Publication Date
2016-06-22

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Abstract

The invention discloses a measuring apparatus for nanometer magnetic materials and a method thereof. The apparatus comprises a detected magnetic sample, a first solenoid, a modulation magnetic field controller, a magnetic probe, a detection magnetic field exciting apparatus and a magnetic force microscope control portion. The magnetic probe is positioned right above the detected magnetic sample. The first solenoid generates an alternating magnetic field under driving of the detection magnetic field exciting apparatus to enable the magnetic probe to undergo magnetic excitation with a corresponding frequency and carry out vibration at the frequency. The first solenoid generates the modulation magnetic field with controllable intensity under the driving of the modulation magnetic field controller, carries out magnetic modulation on the detected magnetic sample and carries out magnetic force imaging on the detected magnetic sample through the magnetic probe carried by the magnetic force microscope control portion. The apparatus and the method of the invention is strong in universality, and is suitable for carrying out accurate observation on samples presenting weak magnetism, especially superparamagnetism in atmosphere environment and at a room temperature. The invention can be widely applied to the field of measurement technology.
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Description

technical field

[0001] The invention relates to the field of measurement technology, in particular to a measurement device and method for nanometer magnetic materials. Background technique

[0002] At present, the magnetic measurement methods for materials mainly include:

[0003] a. The traditional magnetic force microscope (Magnetic Force Microscope, referred to as MFM), by capturing the magnetic interaction between the magnetic probe and the magnetic sample for magnetic imaging, can reflect the magnetic flux leakage and its two-dimensional distribution on the surface of the sample. It is a kind of magnetic material An important tool for the simultaneous characterization of microstructural and magnetic properties. At present, the imaging of the magnetic force microscope usually adopts the method of two-pass scanning. Due to the large distance between the probe and the sample in the magnetic force imaging, its lateral resolution is usually lower than that of the atomic for...

Claims

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