Incoherent Stacking Diffraction Imaging Method Based on Simultaneous Illumination of Multiple Wavelengths
An imaging method and multi-wavelength technology, applied in scattering characteristics measurement, instruments, measurement devices, etc., can solve the problems of long processing period, cumbersome operation, incoherent light illumination unfavorable for diffraction imaging, etc., and achieve image quality enhancement and true color recovery. Enhanced effect
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[0122] In the process of verifying the imaging technology and the corresponding algorithm proposed by the present invention, we have further verified the present invention not only through experiments but also through simulation, because there is no error in the simulation, and the probe and spectral weights are given in the simulation process. Therefore, we only recover the true color pattern of the sample to be tested and the corresponding amplitude and phase information of the sample to be tested at each wavelength. The specific implementation of the simulation part is as follows:
[0123] The amplitude information of the true-color test sample used in the simulation is as follows: Figure 6a As shown, the phase information is as Figure 6b As shown, the complex amplitude distribution of the sample to be tested corresponding to the three wavelengths is as follows Figures 6c-6h shown, where Figure 6c , Figure 6e , Figure 6g The three wavelengths of red, green and bl...
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