The invention discloses a spectrum-image combined
measurement device and
system based on double networks, and relates to the field of wide spectrum
coherent diffraction imaging, the spectrum-image combined
measurement device comprises a
light source, a first lens, an aperture diaphragm, a second lens, a third lens, an imaging object and a
CMOS camera which are arranged along a light path direction, the
CMOS camera receives a
diffraction pattern and transmits the
diffraction pattern to a processor, and the processor is used for
processing the
diffraction pattern. The processor reconstructs the received diffraction pattern by adopting a spectrum-image combined measurement method based on double networks, including collecting the diffraction pattern, and obtaining a fused diffraction pattern after
high dynamic range fusion; a monochromatic diffraction pattern is collected, an actual diffraction distance is obtained in combination with the monochromatic diffraction propagation model, and an actual wide-spectrum physical propagation model is constructed based on the actual diffraction distance; and based on the fused diffraction pattern, reconstructing the image and the spectrum by using a spectrum-image
joint reconstruction algorithm based on double networks to obtain a reconstructed diffraction pattern and spectrum. Spectrum calibration is not needed, the image and the spectrum can be reconstructed at the same time, and the difficulty of wide-spectrum diffraction imaging is greatly lowered.