62 results about "Monochromatic beam" patented technology

The present invention relates to a device (10), a method and an application thereof for optically measuring the surface of a tested product (5), especially a PCB-product for reflow soldering paste inspection. The device comprises at least one white light source (1) for emitting a beam of white light, at least one collimation unit (4) for collimating said beam of white light (30), at least one spectrometer unit, preferably an optical prism (2) or an optical diffraction grading (51), for splitting said beam of white light (30) into a beam of multichromatic light (31) being directed onto said tested product (5) under a predetermined incident angle γ, and at least one camera (3) for recording a reflected beam of monochromatic light (32) of said tested product (5). Z-axis surface height information of said tested product (5) can be extracted from a hue value of said reflected beam of mono chromatic light (32) while relatively moving said tested product (5) in a x-axis scanning direction (9).

The invention relates to a projection system comprising: a polychromatic light source and at least one imaging assembly illuminated by an associated polychromatic illumination beam, and comprising: two separate colored wheels respectively called first and second colored wheel; and three separate imagers respectively called first, second and third imagers. At least one part of the polychromatic beam, called first source beam, illuminating the first colored wheel which separates said source beam into a first monochromatic beam and into a two-tone beam, said first monochromatic beam illuminating the first imager and said two-tone beam being transmitted towards the second colored wheel. The second colored wheel being illuminated by said two-tone beam and separating said two-tone beam into second and third monochromatic beams, respectively illuminating said second and third imagers respectively.

The invention discloses diffraction property low-light test system and method of an acousto-optic tunable filter (AOTF). The system comprises a monochromatic light source system, an optical signal modulation system, an optical system and an photoelectric detection system, wherein the monochromatic light source system can generate monochromatic light beams with continuous and adjustable wavelengths, the frequency modulation can be carried out on the monochromatic light beams by a light chopper after passing through a diaphragm orifice, and an alternating-current optical signal sequentially passes through a collimating lens, a polarizer and an optical filter to form single-wavelength collimated polarized light which is vertically incident to the AOTF; and converged zero-level light and diffracted light generated after driving are bent to different directions by a prism and respectively received by two photoelectric detectors, therefore, the diffraction property of the AOTF is analyzed. The device of the invention has simple principle and strong operability, and can satisfy the continuous wavelength test requirements of the AOTF and simultaneously greatly improve the test efficiency through automatic control software. The invention realizes the low-light condition detection aiming at the application requirement of the AOTF under the low light by utilizing a phase locking circuit and improves the test precision. The system realizes the independent test of the zero-level light and the diffracted light and improves the test accuracy.

An objective lens for converging a monochromatic light flux having a specific wavelength in a range of 350 to 450 nm on an optical information recording medium while the objective lens is placed facing the optical information recording medium, the objective lens comprising: a lens body containing a polymer resin having an alicyclic structure; a first film having a refractive index of less than 1.7 for light having a wavelength of 405 nm; a second film having a refractive index of 1.7 or more for the light having the wavelength of 405 nm; and a third film having a refractive index of 1.55 or less for the light having the wavelength of 405 nm, wherein: the first film, the second film and the third film are provided on the lens body; the first film is provided between the lens body and the second film; the second film is provided between the first film and the third film; and a thickness of the first film is in a range of 50 to 15000 nm.

An objective lens for converging a monochromatic light flux having a specific wavelength in a range of 350 to 450 nm on an optical information recording medium while the objective lens is placed facing the optical information recording medium, the objective lens containing a lens body made of a polymer resin having an alicyclic structure; and an antireflection film including one or more layers provided on a surface of the lens body facing to the optical information recording medium, wherein a refractive index of the antireflection film for a light flux having a wavelength of 405 nm is less than 1.7.

The invention relates to a projection system comprising: a polychromatic light source and at least one imaging assembly illuminated by an associated polychromatic illumination beam, and comprising:two separate colored wheels, respectively called first and second colored wheel; andthree separate imagers, respectively called first, second and third imagers.At least one part of the polychromatic beam, called first source beam, illuminating the first colored wheel which separates said source beam into a first monochromatic beam and into a two-tone beam, said first monochromatic beam illuminating the first imager and said two-tone beam being transmitted toward the second colored wheel.The second colored wheel being illuminated by said two-tone beam and separating said two-tone beam into second and third monochromatic beams, respectively illuminating said second and third imagers respectively.

A light source for injecting excess carriers into a semiconductor wafer, fully illuminating a surface of the wafer. According to the disclosed embodiments, the source includes at least one set of point sources which are spaced apart at regular intervals along the X and Y axes, such that the source emits a monochromatic beam of a size that is at least equal to that of the semiconductor wafer surface to be illuminated. Each of the point sources is sinusoidally modulated by a common electrical modulator, the distance between two point sources and the distance between the source and the semiconductor wafer surface to be illuminated being selected such that the monochromatic light beam uniformly illuminates the surface.

In a wavelength displacement correcting system and method of the invention, a monochromatic beam from a light emitting diode driven by a constant current is incident through an incident slit of a spectral device. The incident beam is diffracted on a diffraction grating to form a dispersed light image, and information relating to the dispersed light image of the incident slit is outputted from the spectral device. A wavelength displacement amount of the monochromatic beam is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width displacement amount of the spectral device is calculated, using the calculated wavelength displacement amount of the monochromatic beam, and the calculated wavelength displacement amounts of at least two diffracted beams, whereby a wavelength displacement of the spectral device is corrected.

A spectrometer arrangement with two-dimensional spectrum, comprising a first dispersing element for spectral separation of radiation in a main dispersion direction, an imaging optics for imaging the radiation entering into the spectrometer arrangement through an entrance slit in an image plane for producing a two-dimensional spectrum, and a detector array with a two-dimensional arrangement of a plurality of detector elements in the image plane, wherein a reflector, a refractor, and / or a lens array are arranged in the beam path at a location where the dispersed, monochromatic beams are separated from one another, and the reflector, the refractor, and / or the lens array have a surface in the form of a freeform surface, such that area occupied by selected images of the entrance slit in the case of different wavelengths in the image plane is optimized over a selected spectral region of the two-dimensional spectrum.

A light coupling device and an image projection apparatus using the same, wherein photoconductive media of the light coupling device include optical fibers that transmit light. Each light coupling device has at least two input terminals, at least two output terminals, and a connector connecting the input and output terminals, wherein the connector forms at least one light path. The light coupling device receives and divides respective R, G, and B monochromatic light beams. By connecting a light source with multiple optical instruments via the light coupling devices, images can be projected on multiple screens. Further, by using optical fibers to transmit light beams, the size of image instruments is minimized and light loss is reduced.

The invention discloses a transparent or semitransparent curved surface contour detecting system which comprises the components of: an illuminating device which is used for emitting a wideband illuminating beam; a dispersive objective lens which is in the light emitting direction of the illuminating beam and is used for realizing dispersion decomposition of the transmitted illuminating beam to a set of monochromatic beams of which the converging points correspond with the wavelength; a checking material supporting member which is used for fixing a transparent or semitransparent checking material; a spectrographic analysis device which is used for receiving upper-surface reflecting light and lower-surface reflecting light and detecting a spectral chromatic aberration between the upper-surface reflecting light and the lower-surface reflecting light; and a processor which is used for receiving the spectral chromatic aberration, obtains the thickness of a scanning position according to thespectral chromatic aberration and determining the contour of the transparent or semitransparent curved surface checking material according to the thickness of two or more than two scanning positions.The system is not affected by the light transmittance of the checking material and can accurately detect the contour.

A projection system is provided, comprising three discrete monochromatic light sources for sequentially providing monochromatic beams of blue, green and red light to a single imager, which modulates the light on a pixel-by-pixel basis to form a matrix of modulated light pixels. Each of the monochromatic light sources has a switching rate consistent with a refresh rate of the projection system for generating sequential, discrete monochromatic beams of light. The monochromatic matrices of modulated light are combined to form a full color viewable image.

A projection system is provided, comprising three discrete monochromatic light sources for sequentially providing monochromatic beams of blue, green and red light to a single imager, which modulates the light on a pixel-by-pixel basis to form a matrix of modulated light pixels. Each of the monochromatic light sources has a switching rate consistent with a refresh rate of the projection system for generating sequential, discrete monochromatic beams of light. The monochromatic matrices of modulated light are combined to form a full color viewable image.

A light-guide light is described that is capable of providing a substantially monochromatic beam of light, and is suitable for use as a signal lamp in an automotive vehicle. The light (1) comprises a housing defining a light-guiding optical cavity (4) having first and second major faces (5, 6), and a light source (11) arranged to direct light into the cavity from one side. The light source may be an array of light emitting diodes providing substantially monochromatic light. The first major face (5) comprises an interference film (for example, a multilayer polymeric film) that, for light at the design wavelength, substantially transmits light that is incident on the film over a limited angular range and substantially reflects light that is incident at other angles. The second major face (6) comprises a scattering reflective material having a reflectance of at least 85%, for example a highly-efficient reflective material provided with a suitable textured pattern.

An optical inspection apparatus includes a broadband light source, a monochromator, an image obtaining apparatus, and an analysis device. The monochromator is configured to convert light from the broadband light source into a plurality of monochromatic beams of different wavelengths and sequentially output the monochromatic beams, where each beam has a preset wavelength width and corresponds to one of a plurality of different wavelength regions. The image obtaining apparatus is configured to allow each monochromatic beam output from the monochromator to be incident to a top surface of an inspection target without using a beam splitter, allow light reflected by the inspection target to travel in a form of light of an infinite light source, and generate 2D images of the inspection target. The analysis device is configured to analyze the 2D images of the inspection target in the plurality of wavelength regions.

The present invention is directed to an optical system for measuring the rotation angle of rotatable object having a rotation shaft (2), which system comprises a reflective diffraction element (6) mounted on said shaft and a module that includes a radiation source (8) emitting a monochromatic beam (bo) towards this element and a radiation-sensitive detection structure (14, 16), the diffraction element is configured to project diffraction order images (18) of its pattern onto associated sections (50(1)-54(2)) of an annular grating structure forming part of the detection structure and the surface size of the diffraction element is smaller than 20% of the surface size of the annular grating structure.

It is a high reproducibility general optics wave plate detector, which is characterized by comprising the white light source, light splitter, imbed test bench and photoelectricity detector along the moving direction of the light beam. The system also comprises A / D converter, computer and controller. The emergent light of the white light source comes to the splitter to get monochromatic beam and then the beam comes to the imbedded test bench and finally is received by the photoelectricity detector and input to computer through A / D converter. And it gets the wave plate parameters through computer process. The imbedded sample is used to polarize the monochromatic light.

The invention discloses a ferrofluid optical current sensor with a horizontal bias device. The ferrofluid optical current sensor comprises a monochromatic source, a polarizer, a ferrofluid film, a polarization analyzer and a photoelectric detector; in addition, a horizontal bias magnetic field generator is arranged in the ferrofluid optical current sensor; during use, monochromatic beams become linearly polarized light through the polarizer, the linearly polarized light which is transmitted in the ferrofluid film is rotated at a certain angle through the ferrofluid film under the modulating action of an externally applied longitudinal magnetic field, and the rotation angle is related to the strength of the externally applied longitudinal magnetic field, so the magnitude of the current for generating the externally applied longitudinal magnetic field can be obtained by detecting the rotation angle of the linearly polarized light, the magnetic moment turning speed of magnetic particles can be improved through a magnetic field generated by the horizontal bias magnetic field generator when the magnetic particles in the ferrofluid are modulated by the externally applied longitudinal magnetic field, the response time is shortened, and the sensitivity and the accuracy of the sensor are improved; and based on the sensor, the invention also discloses a current measuring method.

The invention discloses a detection system for diffraction efficiency of a transmission grating. The detection system comprises a laser plasma light source, a monochromatic beam-splitting device and areceiving device, wherein the laser plasma light source is used for generating incident beams comprising soft X rays and extreme-ultraviolet wavebands; the monochromatic beam-splitting device is usedfor receiving the incident beams and selecting the soft X rays or the extreme-ultraviolet wavebands to exit; a to-be-detected transmission grating is arranged on a light exiting path of the monochromatic beam-splitting device; and the receiving device is used for receiving emergent images of the monochromatic beam-splitting device or receiving a diffraction image of the to-be-detected transmission grating, so that relative diffraction efficiency and / or absolute diffraction efficiency of the to-be-detected transmission grating can be analyzed according to the emergent images and the diffraction image. Therefore, according to the technical scheme provided in the invention, the adopted laser plasma light source has the advantages of small size, low price and the like, requirements of numerous laboratories can be met, and the detection system provided by the invention has the advantages of simple structure, convenient debugging and low cost.

The present invention is directed to an optical system for measuring the rotation angle of rotatable object having a rotation shaft (2), which system comprises a reflective diffraction element (6) mounted on said shaft and a module that includes a radiation source (8) emitting a monochromatic beam (bo) towards this element and a radiation-sensitive detection structure (14, 16), the diffraction element is configured to project diffraction order images (18) of its pattern onto associated sections (50(1)-54(2)) of an annular grating structure forming part of the detection structure and the surface size of the diffraction element is smaller than 20% of the surface size of the annular grating structure.

A method for fabricating a supermirror for forming a neutron guide. In the method, a neutron supermirror, which is widely used in the formation of thin films in cold neutron guides and the spectrometer field, is fabricated with nickel thin films and titanium thin films, having varying thickness, using a combination of monochromator structures in which nickel thin films and titanium thin films, having the same thickness, are stacked in the form of periodic structures. According to the method, a combination of monochromator structures having a variety of different thicknesses is formed, such that the amount of the overlap of peaks due to the monochromator structures can be adjusted to increase reflectivity, and some of the monochromator structures can be removed during the fabrication of the supermirror to make it easy to extract monochromatic beams, such that it is easy to fabricate a transmission monochromator, rather than a reflection monochromator.

The present invention relates to a double-crystal monochromator crystal switching mechanism to satisfy the switching of a synchrotron radiation double-crystal monochromator work crystal, and thus the monochromatic beam lines of three energy points of 2.1, 2.3 and 2.5KeV (kilo-electron volt energy unit) needed by scientific research are provided. A crystal fixed assembly is used to fix three groove crystals, through a crystal support, the crystals are fixed at the shaft ends of a spindle in a certain angle, and the three crystals are installed side by side along a spindle axis direction. Through operating a hand wheel, a screw rod is driven to rotate, the slider on the screw rod and the base of a spindle device are fixed, the motion transfer among the components of the screw rod, a linear guide rail, the spindle device and the like allows the spindle to move along the axis direction, thus the fixed crystals are switched well, and the smooth motion, accurate positioning and switching of the crystals can be realized. The positions of the movements of the crystals are accurately calibrated, an accessory component limiting block and a positioning block are added, and the safety of crystal movement and the reliability of crystal switching can be ensured. Through the comprehensive considerations and design, the precise switching of the crystals can be realized.

The present disclosure provides an optical structure and a manufacturing method thereof, a light source system, and a detection device. A basic structure of a spectrum test and the manufacturing method thereof are simplified. The optical structure comprises an optical waveguide for transmitting light, wherein the optical waveguide comprises a light inlet surface and a light outlet surface; a colorseparation device disposed at the light outlet surface of the optical waveguide and configured to separate the light from the optical waveguide into multiple monochromatic light beams; and multiple monochromatic light output channels arranged at the light outlet surface of the color separation device, wherein multiple monochromatic light output channels are configured to output multiple monochromatic light beams from the color separation device.

The invention discloses an on-line optical measurement system and an online optical measurement method for the influence of rotary eccentricity on the crystalline state of a spin-coated film. The system comprises a light source module (100), an incident light beam adjustment module (200), a polarization state regulation and control module (300), a polarization state detection module (400) and a light beam acquisition module (500), the light source module (100) outputs a collimated monochromatic light beam, a linear light beam with a set light beam section shape and size is formed through the incident light beam adjusting module (200); an illumination light beam with a set polarization azimuth angle is formed through the polarization state regulation and control module (300), a reflected light beam is formed after the illumination light beam is reflected by a sample, linearly polarized light with a set polarization direction is formed through the polarization state detection module (400), and the area array measurement of the light intensity of the cross section of the light beam is carried out through the light beam acquisition module (500). According to the invention, the polarization state regulation and control of an incident light beam can be realized, and sample information of multiple polarization azimuths is obtained; optical signals of different centrifugal positions ofthe sample are effectively distinguished; the optical path structure is simple, the expansibility is good, and the optical device interchangeability is good.

A reflective sample, such as a mask, is imaged in an optics system. A radiation source emits a light beam with relatively low coherence. A first focusing element focuses the beam before a mirror reflects the focused beam towards the sample at an incidence angle of between 2 and 25° A pinhole aperture plate upstream of the sample has a first aperture to focus and cut-off the beam diameter to form a more monochromatic beam. The sample is displaced by a mechanism in a direction perpendicular to the normal vector of the sample surface while it reflects the light beam. The reflected beam passes a second aperture in the pinhole aperture plate next to the first aperture on its way to a pixel detector. The second aperture limits the diameter of the reflected beam, thereby adjusting the diameter of the light beam before it reaches the pixel detector.

A wavelength displacement correcting system and method where a monochromatic beam from an LED is incident through an incident slit of a spectral device and is diffracted on a diffraction grating to form a dispersed light image. Information relating to the dispersed light image is outputted and a wavelength displacement is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width is calculated, using the calculated wavelength displacement amount of the beam, and the calculated wavelength displacement amounts of at least two diffracted beams.

A true color liquid crystal displaying device is disclosed in the present invention. The true color liquid crystal displaying device includes a light guide module, a LED light source, and a liquid crystal panel without a color filter. The light guide module includes a light guide body, an optical input portion and an emitting surface. The emitting surface includes an emitting area. The LED light source is disposed on the optical input portion of the light guide module for emitting RGB beams. The liquid crystal panel is disposed above the emitting surface of the light guide module. The emitting area aligns with a sub-pixel of the liquid crystal panel. The optical cable inside the light guide module guides the monochromatic beam from the LED light source to each corresponding sub-pixel of the liquid crystal panel, so that the RGB beams is the pixel of the true color performance.

An improved wavelength division multiplexing device (10) is disclosed. The improved wavelength division multiplexing device (10) has a diffraction grating (18) for combining a plurality of monochromatic light beams (24) into one multiplexed polychromatic light beam. The improvement in the improved wavelength division multiplexing device (10) is to utilize a diffractive optical collimating / focusing lens (16) for collimating a plurality of monochromatic light beams (24) propagating along a first direction (24') to a diffraction grating (18), and for converging the multiplexed polychromatic light beam (26) from the diffraction grating (18) propagating along the second direction (26'), wherein the second direction (26') is approximately the same as the first direction (24') on the contrary.