Universal optical wave plate detector with high reproducibility

A general-purpose optical and reproducible technology, applied in the field of optical measurement, can solve problems such as low measurement efficiency and complex instruments, and achieve the effects of strong versatility, high measurement accuracy and good repeatability
CN1632501AInactive Publication Date: 2005-06-29SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Publication Date
2005-06-29
Estimated Expiration
Not applicable · inactive patent

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Abstract

It is a high reproducibility general optics wave plate detector, which is characterized by comprising the white light source, light splitter, imbed test bench and photoelectricity detector along the moving direction of the light beam. The system also comprises A / D converter, computer and controller. The emergent light of the white light source comes to the splitter to get monochromatic beam and then the beam comes to the imbedded test bench and finally is received by the photoelectricity detector and input to computer through A / D converter. And it gets the wave plate parameters through computer process. The imbedded sample is used to polarize the monochromatic light.
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Description

technical field

[0001] The invention relates to optical measurement, in particular to a high-reproducibility universal optical wave plate detector. It is mainly used to measure the retardation angle and thickness of optical waveplates. technical background

[0002] Waveplates are widely used in photoelasticity, optical measurement, materials science, biology, physics and other fields. In these applications, there are usually strict requirements on the quality of the wave plate, and the performance of the wave plate needs to be accurately measured after processing to ensure that its accurate parameters are known during use. Currently widely used measurement technology (see prior art [1] "Development of 1.06μm quarter-wave plate with He-Ne laser" Jiang Bingzhi et al., "Laser Journal", Vol.7 No.1 1986.P.24) Generally, only one wave plate (1 / 4, 1 / 2, etc.) or a single wavelength can be measured, and the instrument is complex and the measurement efficiency is low. Contents of ...

Claims

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