Ultrafast lens-free coherent electron diffraction imaging method and device

A technology of electron diffraction and imaging method, applied in circuits, discharge tubes, electrical components, etc., can solve the problems of limited time and space resolution, no high time resolution ability, etc., to achieve the effect of simple structure and cost reduction
CN102903591AInactive Publication Date: 2013-01-30SHANGHAI JIAO TONG UNIV
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Patent Information

Authority / Receiving Office
CN Β· China
Current Assignee / Owner
SHANGHAI JIAO TONG UNIV
Publication Date
2013-01-30
Estimated Expiration
Not applicable Β· inactive patent

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Abstract

The invention discloses an ultrafast lens-free coherent electron diffraction imaging method and device. The method is combined with the electronic pulse which is in precise synchronization with process exciting sources (such as femtosecond laser pulses) and a lens-free coherent electron diffraction imaging technology, and comprises the steps of analyzing the strength distribution of the diffracted coherent electronic pulses, and carrying out back calculation to determine the electronic scattering phase, so as to achieve the reconstruction of the structure and the appearance of three-dimensional transient atomic scale. By adopting the method and device disclosed by the invention, the technical problem that the conventional electronic microimaging method has no high time resolution or the existing ultrafast electronic imaging time and space resolution are limited can be solved.
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Description

technical field

[0001] The present invention relates to time-resolved electron microscopy imaging, in particular to an ultrafast lensless coherent electron diffraction imaging method with a temporal resolution better than 1 picosecond and a spatial resolution better than 1 nanometer and a possible corresponding device. Background technique

[0002] The background technology involved in the present invention is divided into two aspects;

[0003] 1. The temporal and spatial resolution of the electron microscope: The traditional electron microscopic imaging has three main directions: increasing the electron accelerating voltage, using an electromagnetic lens, and improving the quality of the electron source, and its spatial resolution has been improved to the limit. Since traditional electron microscopic imaging is generally time-accumulated topography imaging, it is impossible to perform high-time-resolved imaging of processes in various fields such as physics, chemistry, and ...

Claims

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