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SRAM type FPGA trigger single-event upset resistance performance assessment system and method

An anti-single event effect and trigger technology, applied in the direction of instruments, measuring devices, measuring electricity, etc., can solve the problems of inaccuracy, complex realization, missed judgment, etc., to simplify the test process, enhance the accuracy and reliability, and improve the The effect of trial efficiency

Inactive Publication Date: 2016-06-29
BEIJING MXTRONICS CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method is complex and inaccurate. An even number of flips and flip-flops at the same position in the two shift register chains will cause the method to miss a judgment.
[0004] The existing patents mainly include: (1) A single particle radiation test system and method based on JTAG interface, application number: 201410706041.2, publication number: 104483622A, the application does not involve trigger testing
(2) SRAM-type FPGA single event effect test system and method, application number: 201110214108.7, publication number: 102332307A, the patent only involves the static test of the flip-flop, and does not explain the dynamic testing of the flip-flop; the refresh operation involved in this patent Controlled by the single-chip processor, no refresh chip is used
(3) A SRAM-type FPGA single-particle irradiation test system and method, application number: 201310724722.7, publication number: 103744014A, which macroscopically expounds the tests of FPGA configuration memory, block memory, triggers, etc., about the trigger test not elaborated
[0005] In a word, the above-mentioned prior art cannot accurately and comprehensively evaluate the anti-single event effect performance of the FPGA flip-flop. The present invention overcomes the deficiencies of the prior art and provides an accurate and reliable evaluation system and method for the anti-single event effect performance of the FPGA flip-flop

Method used

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  • SRAM type FPGA trigger single-event upset resistance performance assessment system and method
  • SRAM type FPGA trigger single-event upset resistance performance assessment system and method

Examples

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Embodiment Construction

[0025] Such as figure 1Shown, a kind of SRAM type FPGA flip-flop anti-single event effect performance evaluation test system of the present invention comprises host computer and test board; The host computer is placed in the test monitoring room, is used for carrying out test setting, test process control and test result display The test board is placed in the irradiation laboratory; the test board includes a control processing FPGA, a configuration PROM, a refresh chip, a storage PROM, a SRAM and a tested FPGA; , Configuration PROM, connected to the communication interface; the control processing FPGA is connected to the host computer through the communication interface; the storage PROM is used to store the test code stream used to configure the tested FPGA for reading by the refresh chip; the configuration PROM is used to store configuration control processing FPGA configuration code stream; the tested FPGA is placed in the irradiation test area; the control processing FPGA...

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Abstract

The present invention provides a SRAM type FPGA flip-flop anti-single event effect performance evaluation system and method. The test system includes a host computer and a test board; the test board includes a control processing FPGA, configuration PROM, refresh chip, storage PROM, SRAM and a Test the FPGA; the host computer is responsible for process control and data processing; the test board is responsible for processing the commands sent by the host computer and performing trigger single event flip detection. The present invention uses the built-in CAPTURE module of the FPGA to capture the trigger data into the configuration memory and read back the comparison to complete the static test of the trigger SEU (Single-Event Upset), and use the shift register chain configured by the trigger to input and output data Sequence comparison is used to complete the flip-flop SEU (Single-Event Upset) dynamic test, and the system can perform a stable and reliable evaluation of the anti-single event effect performance of the SRAM-type FPGA flip-flop.

Description

technical field [0001] The invention relates to a SRAM-type FPGA anti-single-event effect performance evaluation system and method, mainly for single-event upturn effect SEU (Single-EventUpset), belonging to the field of FPGA testing and irradiation testing. Background technique [0002] The application of SRAM type FPGA in the space field requires not only high reliability, but also radiation resistance is a problem that must be considered. When the SRAM type FPGA works normally, the data stored in the flip-flops and memory units often change with the operation of the circuit. These storage units are hit by high-energy particles while the data remains stable and the data changes. Whether there is a difference in the single-event flipping cross-section under the two cases of being hit by high-energy particles during the process is of great significance to the reliability evaluation of the SRAM-type FPGA working in the space radiation environment. Flip-flops are widely distr...

Claims

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Application Information

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IPC IPC(8): G01R31/3181
CPCG01R31/3181
Inventor 李学武冯长磊朱志强张进成陈雷张帆孙雷王媛媛
Owner BEIJING MXTRONICS CORP
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