Pulse width modulator single event effect time-sensitive characteristic analyzing method
A single event effect and pulse width modulator technology, which is applied in electronic circuit testing, non-contact circuit testing, etc., can solve the problems of multiple functional modules, single event effect time-sensitive characteristics that have not been reported, and complex structure of pulse width modulators, etc. problem, to achieve the effect of experiment economy and convenience
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[0050] figure 1 It is a flow chart of a method for analyzing the time-sensitivity characteristics of a single event effect of a pulse width modulator in the present invention.
[0051] The method includes the following steps:
[0052] S1] Before the experiment, uncap the experimental samples. After uncapping, perform a functional test on the samples. Those that pass the functional test are reserved for subsequent experiments. Uncapping treatment refers to removing the top package of the sample, exposing the wafer of the sample, and at the same time ensuring that the bonding wires and pins of the sample are intact and the sample is functioning normally. Mechanical methods are generally used for uncapping ceramic package samples, and plastic package samples are uncapped. Generally, chemical corrosion methods are adopted, and experiments that do not have the ability to open the cover can entrust relevant device reliability testing units to provide professional cover-opening serv...
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