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Pulse width modulator single event effect time-sensitive characteristic analyzing method

A single event effect and pulse width modulator technology, which is applied in electronic circuit testing, non-contact circuit testing, etc., can solve the problems of multiple functional modules, single event effect time-sensitive characteristics that have not been reported, and complex structure of pulse width modulators, etc. problem, to achieve the effect of experiment economy and convenience

Active Publication Date: 2016-07-13
NORTHWEST INST OF NUCLEAR TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the complex structure and many functional modules of the pulse width modulator, the research on the time-sensitive characteristics of the single event effect of the pulse width modulator has not been reported.

Method used

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  • Pulse width modulator single event effect time-sensitive characteristic analyzing method
  • Pulse width modulator single event effect time-sensitive characteristic analyzing method
  • Pulse width modulator single event effect time-sensitive characteristic analyzing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] figure 1 It is a flow chart of a method for analyzing the time-sensitivity characteristics of a single event effect of a pulse width modulator in the present invention.

[0051] The method includes the following steps:

[0052] S1] Before the experiment, uncap the experimental samples. After uncapping, perform a functional test on the samples. Those that pass the functional test are reserved for subsequent experiments. Uncapping treatment refers to removing the top package of the sample, exposing the wafer of the sample, and at the same time ensuring that the bonding wires and pins of the sample are intact and the sample is functioning normally. Mechanical methods are generally used for uncapping ceramic package samples, and plastic package samples are uncapped. Generally, chemical corrosion methods are adopted, and experiments that do not have the ability to open the cover can entrust relevant device reliability testing units to provide professional cover-opening serv...

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Abstract

The invention relates to a pulse width modulator single event effect time-sensitive characteristic analyzing method.The method comprises the steps of conducting laser pulse traverse scanning on all function modules of a sample to obtain single event effect failure modes and single event effect sensitive parameters of all the function modules, selecting typical incident positions of all the function modules to enable a laser pulse to have incidence to the typical incident positions of all the function modules according to a certain incident period, analyzing and obtaining single event effect time-sensitive information of all the function modules, obtaining the single event effect time-sensitive characteristic of a pulse width modulator and the like.According to the method, pulse width modulator single event effect time-sensitive characteristic analysis is achieved by combining controllable scanning of the laser pulse and single event effect sensitive parameter extraction of all the function modules on the basis of function module partition of the pulse width modulator, and the method is novel, is an important supplement for heavy-ion single event effect ground simulation tests and provides a support for single event effect time-sensitive characteristic research of more complex digital and analog hybrid circuits.

Description

technical field [0001] The invention relates to a method for analyzing the time-sensitive characteristic of a single event effect of a pulse width modulator, and belongs to the technical field of space radiation effect and reinforcement. Background technique [0002] There are a large number of high-energy particles in the universe. The high-energy particles penetrate the shielding layer of the spacecraft and enter the internal electronic system and interact with the semiconductor devices in the system to generate electron-hole pairs. The electron-hole pairs are sensitive circuits in the system. After the nodes are collected, the system function is damaged, which affects the reliable operation of the spacecraft in orbit. This effect is the result of the action of a single particle, hence the name Single Event Effect (SEE). [0003] The pulse width modulator (PWM) is mainly used in the switching power supply system in the spacecraft, and the single event effect may cause cha...

Claims

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Application Information

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IPC IPC(8): G01R31/308
CPCG01R31/308
Inventor 赵雯郭晓强陈伟郭红霞丁李利陈荣梅王园明
Owner NORTHWEST INST OF NUCLEAR TECH
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