Display substrate, light-on equipment and detection method of light-on test pin alignment

A technology for displaying substrates and test probes, which is applied in the direction of lamp testing, measuring devices, and measuring electrical variables. It can solve problems such as greater influence on proficiency, low accuracy, and time-consuming, so as to achieve high reliability and eliminate detection errors. , The effect of reducing the risk of static electricity and product damage

Inactive Publication Date: 2016-07-20
BOE TECH GRP CO LTD +1
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Problems solved by technology

This method is time-consuming, has low accuracy,

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  • Display substrate, light-on equipment and detection method of light-on test pin alignment

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Embodiment Construction

[0033] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the following will clearly and completely describe the technical solutions of the embodiments of the present invention in conjunction with the drawings of the embodiments of the present invention. Apparently, the described embodiments are some, not all, embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the described embodiments of the present invention belong to the protection scope of the present invention.

[0034] In order to solve the technical problems such as the inability to accurately judge the misalignment of the probes and the time-consuming technical problems in the lighting test of the display substrate in the prior art, the embodiment of the present invention provides a display substrate, a lighting device, and a lighting test probe alignment The detection method can automatically ju...

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Abstract

The invention provides a display substrate, light-on equipment and a detection method of light-on test pin alignment.The display substrate comprises a display drive signal line and at least a group of testing bonding pads, and the plurality of testing bonding pads in the same group are sequentially arranged.Each group of testing bonding pads comprises the plurality of light-on testing bonding pads connected with the display drive signal line and two pin miss testing bonding pads which are not connected with the display drive signal line, and the two pin miss testing bonding pads are electrically connected.The arrangement of each group of pins in the light-on equipment is identical with the arrangement of the group of testing bonding pads corresponding to the group of pins.The detection method uses the light-on equipment to perform light-on test pin alignment detection on the display substrate.By the display substrate, the light-on equipment and the detection method, extra detection time is not needed, high reliability is achieved, staff needs not to contact the display substrate during operation, static is reduced, and product damage risks are lowered.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a display substrate, a lighting device, and a method for detecting alignment of a lighting test probe. Background technique [0002] In the production process of liquid crystal display (Liquid Crystal Display, LCD), active matrix organic light emitting diode (Active-matrix organic light emitting diode, AMOLED) and other display panels, multiple inspection procedures need to be carried out, one of which is very important. The display substrate is tested (CellTest) to confirm whether the display substrate is defective. CellTest, referred to as ET, is carried out before the display substrate is attached with the driver chip and the flexible circuit board for inputting the display signal. [0003] The testing process is usually to input a test signal to the display substrate through the lighting equipment to make the pixels appear in color, and then use the defect detection device ...

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Application Information

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IPC IPC(8): G02F1/13
CPCG02F1/1309G01R1/06794G01R1/07314G01R31/44
Inventor 曲毅张国庆孙志刚杨红霞包珊珊王军梁团
Owner BOE TECH GRP CO LTD
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