Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System-level wafer packaging structure and packaging method

A wafer packaging and system-level technology, applied in the direction of electrical components, electrical solid devices, circuits, etc., can solve the problems of long process flow, low efficiency, slow speed, etc., to reduce process steps, improve production efficiency, and improve production quality. rate effect

Inactive Publication Date: 2016-08-03
XINFOO SENSOR TECH CO LTD
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The problem in the existing technology is that each functional chip needs to be placed on the adapter board once, bonded, and finally packaged as a whole. The process is long, slow and inefficient.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System-level wafer packaging structure and packaging method
  • System-level wafer packaging structure and packaging method
  • System-level wafer packaging structure and packaging method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] The present invention will be further described below in conjunction with accompanying drawing.

[0025] see figure 1 , a system-on-wafer package structure, including a substrate wafer 10 formed with circuits, the substrate wafer may be a single-layer wafer or a multi-layer stacked wafer in which multiple wafers are bonded together; The interposer 20 arranged on the substrate wafer 10; a plurality of functional chips 30 of uniform height arranged on the interposer 20; also includes a package 70 for packaging a plurality of functional chips, the package 70 may be a plastic, metal or ceramic cover.

[0026] The key point of the present invention is that: the lower surface of the functional chip 30 and the upper surface of the adapter board 20 are also respectively formed with positioning bumps 40 and positioning grooves 50 or positioning grooves 50 and positioning bumps 40, which are used in the placement process. The functional chip 30 is fastened and fixed on the adap...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a system-level wafer packaging structure. The system-level wafer packaging structure comprises a substrate wafer provided with a circuit, an adapter plate arranged on the substrate wafer, multiple function chips which are arranged on the adapter plate and have same heights, and a packaging body used for packaging the multiple function chips, wherein positioning convex points and positioning grooves or positioning grooves and positioning convex points used for fixedly clamping the function chips on the adapter plate are formed on the lower surface of the function chips and the upper surface of the adapter plate. According to the system-level wafer packaging structure, the positioning convex points and the positioning grooves on the adapter plate and the function chips are employed to replace a traditional mounting mode, so mounting alignment precision is substantially improved, the function chips are further prevented from deviating in a bonding process, the production yield is substantially improved, moreover, in a mounting and bonding process, all the function chips can realize merging and eutectic bonding onto the adapter plate at one time, multiple times of mounting and bonding in the traditional mode can be prevented, technology steps are greatly reduced, and production efficiency is substantially improved.

Description

technical field [0001] The invention relates to wafer packaging technology, in particular to a system-level wafer packaging structure and packaging method. Background technique [0002] Integrating multiple chips with different functions in one unit can form a system-on-chip to realize electrical functions. In the existing technology, the packaging process of system-on-chip usually adopts wafer-level packaging, specifically: bonding an adapter board on the substrate wafer, and then mounting multiple functional chips in stages (through flux, etc. Bonded on the adapter board), bonding, and finally packaged as a whole, and then sliced ​​to form an independent system-on-chip after packaging. The problem existing in the prior art is that each functional chip needs to be mounted and bonded on the adapter board once, and finally packaged as a whole, which has a long process, slow speed and low efficiency. Contents of the invention [0003] In order to solve the above problems, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L25/065H01L23/31H01L21/98
CPCH01L2224/97H01L25/0655H01L23/3121H01L25/50
Inventor 赵照
Owner XINFOO SENSOR TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products