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NTC heat-sensitive chip testing method

A test method and chip technology, applied in thermometer test/calibration, heat measurement, measurement device, etc., can solve the problem of large hidden danger of misjudgment, avoid manual misjudgment, avoid product contamination, and improve test efficiency.

Active Publication Date: 2016-08-10
JURONG BOYUAN ELECTRONICS
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Problems solved by technology

At the same time, the test results are also judged by manually reading the resistance value on the resistance tester to determine whether the accuracy requirements of the NTC thermal chip / resistor (sensor) are met, and there is a large risk of misjudgment

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  • NTC heat-sensitive chip testing method

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[0014] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0015] NTC thermosensitive chip test method of the present invention, concrete steps are as follows:

[0016] 1. Using the oil tank test method commonly used in the prior art, find a product with a resistance value close to the center value RS of the product specification in the same batch of products to be tested, record the resistance value, and use it as a benchmark product; search for a product in the same environment For a product whose resistance value is close to the lower limit or upper limit of the specification of this batch of products, record the resistance value as RC as the limit product. Calculate the deviation C between the limit product resistance value and the standard central value RS, C=RC / RS-1.

[0017] 2. Connect the reference product to the reference terminal of the thermistor tester and the limit product to the test terminal of the HG...

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Abstract

The invention discloses an NTC heat-sensitive chip testing method, and belongs to the field of electronic component preparation. The NTC heat-sensitive chip testing method comprises the steps of testing to acquire a benchmark product and a limit product in the same batch of products to be tested and calculating to acquire deviation between the benchmark product and the limit product, connecting the benchmark product and the limit product to a thermistor tester at the normal temperature so as to be tested and comparing the benchmark product and the limit product to acquire a percentage deviation value, setting a resistance range of qualified products in the thermistor tester, and carrying out constant temperature treatment on a product to be tested and the benchmark product in a normal temperature environment and connecting the thermistor tester to test, wherein if the resistance of the product to be tested meets the set range, the product to be tested is a qualified product. The method disclosed by the invention converts a test for an NTC heat-sensitive chip in an oil tank / water tank environment to a test in a normal state environment, requirements for the test environment are low, the NTC heat-sensitive chip is tested directly without loading or unloading a fixture in the testing process, the test process is simplified, the test efficiency is improved, and the test speed is about 8 times of the test speed of an oil tank testing method.

Description

technical field [0001] The invention relates to a method for testing electronic components, in particular to a method for testing NTC thermosensitive chips, and belongs to the field of electronic component preparation. Background technique [0002] NTC thermal chips / resistors (sensors) have strict requirements on the accuracy of their own resistance. The resistance value of NTC thermal chip / resistor (sensor) is greatly affected by temperature. The test process usually has higher environmental requirements for NTC thermal chip / resistor (sensor). Generally, it is tested in a constant temperature water tank / oil tank. NTC thermal Sensitive chips can only be tested in non-conductive media; the chips are relatively small, and the testing process is cumbersome and inefficient. If it is tested in oil, the chip needs to be cleaned after the test. At the same time, the test results are also judged by manually reading the resistance value on the resistance tester to determine whether...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01K15/00
CPCG01K15/007
Inventor 汤成平刘刚王梅凤高进薛云峰唐敏
Owner JURONG BOYUAN ELECTRONICS
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