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Modal testing method, device and system for micro reticulated shell structure

A technology of structural mode and testing method, which is applied in the testing of machines/structural components, measuring devices, vibration testing, etc., can solve the problems of low utilization rate of excitation energy, high noise at the test site, and poor response signal-to-noise ratio, etc., to achieve Reduce excitation energy loss, improve the effect of poor signal-to-noise ratio and low noise

Active Publication Date: 2019-02-12
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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Problems solved by technology

[0004] Based on this, it is necessary to provide a modal test method, device and system for a micro-reticulated shell structure in response to the above problems, which can economically, efficiently and accurately obtain the modal parameters of the micro-reticulated shell structure. method, which solves the problems of narrow frequency band, low utilization rate of excitation energy, poor response signal-to-noise ratio and large noise at the test site in the sound excitation

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  • Modal testing method, device and system for micro reticulated shell structure
  • Modal testing method, device and system for micro reticulated shell structure
  • Modal testing method, device and system for micro reticulated shell structure

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[0032] In order to further illustrate the technical means adopted by the present invention and the achieved effects, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings and preferred embodiments.

[0033] Such as figure 1 As shown, a micro-reticulated shell structure modal test method, including steps:

[0034] S110. According to the image of the reticulated shell structure to be tested acquired by the laser head, arrange each measuring point of the reticulated shell structure to be tested, wherein the reticulated shell structure to be tested is fixed on the piezoelectric wafer;

[0035] S120. Obtain an excitation signal output from the signal generator to the piezoelectric wafer;

[0036] S130. When the piezoelectric wafer receives the excitation signal and vibrates, measure the vibration response signals of each measuring point;

[0037] S140. According to the excitation signal and th...

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Abstract

The invention relates to a modal testing method, a modal testing device and a modal testing system of a micro latticed shell structure. The modal testing method comprises the steps of arranging measuring points of a latticed shell structure to be tested according to an image, which is acquired by a laser head, of the latticed shell structure to be tested, wherein the latticed shell structure to be tested is fixed on a piezoelectric wafer, acquiring excitation signals outputted to the piezoelectric wafer by a signal generator, measuring vibration response signals of each measuring point when the piezoelectric wafer receives the excitation signals and generates vibrations, acquiring a frequency-response function of each measuring point corresponding to the excitation signals according to the excitation signals and the vibration response signals of each measuring point, and acquiring modal parameters of the latticed shell structure to be tested according to the frequency-response functions. According to the invention, a problem of modal testing above 20KHz is solved, the excitation energy loss is reduced, the utilization rate is high, the signal-to-noise ratio difference of vibration response is improved, the noise in the testing process is low, input signals are not required to be measured additionally, and the method is convenient and simple.

Description

technical field [0001] The invention relates to the technical field of modal testing, in particular to a modal testing method for a micro reticulated shell structure, a modal testing device for a micro reticulated shell structure and a modal testing system for a micro reticulated shell structure. Background technique [0002] Due to its unique mechanical properties, the micro-reticulated shell structure is often used as a key component of high-end precision electronic products, such as sensitive components of precision instruments, grids of grid-controlled traveling wave tubes, etc. Because of this, its dynamic characteristics have an important impact on the performance and reliability of precision electronic products. The modal test of the micro-reticulated shell structure is to obtain the modal parameters such as the natural frequency and mode shape of the structure by means of experiments, so as to accurately predict the response characteristics of the structure under var...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M7/02
CPCG01M7/02
Inventor 朱军华宋芳芳恩云飞
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH