Photovoltaic device IP grade test method
A test method and technology for photovoltaic devices, applied in the field of high-level testing, can solve the problems of insufficient insulation coating length and large area at the outlet end of the connector, and achieve the effects of easy production line promotion and realization, convenient operation, and optimized production and assembly process.
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[0024] The present invention will be described in detail below with reference to the embodiments shown in the accompanying drawings. However, this embodiment does not limit the present invention, and any structural, method, or functional changes made by those skilled in the art according to this embodiment are included in the protection scope of the present invention.
[0025] Please refer to figure 1 and figure 2 Shown is a preferred embodiment of the present invention, the photovoltaic device IP level test method of the present invention mainly comprises the following steps:
[0026] Provide a container 1 filled with water;
[0027] Provide an insulation resistance tester;
[0028] Provide a test sample 2 of a photovoltaic device, place it in the container and completely submerge it in water, and make the outlet end of the test sample 2 exposed to the water surface and connected to the positive pole of the insulation resistance tester;
[0029] A metal conductive block ...
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Abstract
Description
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