Airfield runway foreign matter and crack recognizing system and detecting and recognizing method thereof
A technology for airport runways and identification systems, which is applied in measuring devices, optical testing for flaws/defects, and material analysis through optical means, can solve problems such as low efficiency, high cost, and unsuitability for popularization, and achieve low cost and Maintainable, easy-to-modify effects
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[0024] The technology of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0025] Such as figure 1 , 2 , shown in 3, the recognition system of airport runway foreign body and crack of the present invention comprises camera, FPGA processor, DSP processor, and described camera, FPGA processor, DSP processor are connected successively, and described FPGA processor and DSP process The controllers are respectively connected with display modules.
[0026] The camera is a CMOS camera.
[0027] The external expansion of the FPGA processor has one SDRAM and one SRAM; the external expansion of the DSP processor has two SDRAMs and one FLASH.
[0028] The camera is connected with a power supply module and an auxiliary lighting module.
[0029] The present invention also provides a method for detecting and identifying foreign matter and cracks on an airport runway by using the above-mentioned system...
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