Photovoltaic connection box and photovoltaic assembly connection system

Abstract

The present invention relates to a photovoltaic connection box and a photovoltaic assembly connection system. The photovoltaic connection box comprises a box body and an anode connection end, a cathode connection end and four assembly connection ends arranged at the exterior of the box body and a bypass diode module or a smart power management module arranged at the interior of the box body. The photovoltaic connection box and the photovoltaic assembly connection system avoid the problem that the assembly is failed in the generation usage process caused by unstable bonding between a connection box and the photovoltaic assembly, avoid the problem that the connection box itself is damaged after the heat generated after a hot spot effect bypass diode works cannot be radiated because one part of the photovoltaic module or the whole photovoltaic module is shielded once in the assembly work process, prevent the heat in the connection box from influencing the assembly backboard and the glass, and can perform optimization of the assembly generation power.

Description

technical field [0001] The invention relates to a photovoltaic junction box and a photovoltaic assembly wiring system, and belongs to the field of photovoltaic assembly wiring. Background technique [0002] For traditional photovoltaic modules, the junction box integrates bypass diodes pasted on the back of the photovoltaic module, and the bypass diodes are connected in parallel to the battery strings of the photovoltaic module. Due to the existence of parallel circuits, as long as there is a path between the diodes and the battery strings, the entire The circuit is connected, and it is impossible to determine the fault of the diode or battery string. At the same time, there is no way to check the status of each component in the photovoltaic modules installed and put into use in the market. Only the status of each power generation photovoltaic module can be monitored. The condition of the array. [0003] Diodes generate heat, and the temperature in the junction box area wil...

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Problems solved by technology

[0002] For traditional photovoltaic modules, the junction box integrates bypass diodes pasted on the back of the photovoltaic module, and the bypass diodes are connected in parallel to the battery strings of the photovoltaic module. Due to the existence of parallel circuits, as long as there is a path between the diodes and the battery strings, the entire The circuit is connected, and it is impossible to determine the fault of the diode or battery string. At the same time, there is no way to check the status of each component in the photovoltaic modules installed and put into use in the market. Only the status of each power generation photovoltaic module can be monitored. The working condition of the array

[0003] Diodes generate heat, and the temperature in the junction box area will rise rapidly, resulting in a sudden rise in the local temperature of the junction box of the component, which brings potential risks to the component (such as the temperature of the glass of the component rises, local internal stress will be generated, and there will be cracks. Risk; when the temperature is very high and encounters sudden rain, the temperature of the glass drops sharply, and there is also a risk of cracking; in winter, there is local unmelted snow, which is a time period when the bypass diode has a very high probability of working. The component glass at the junction box position The temperature is high, and the temperature of the melted snow water on the upper part is close to 0 degrees, which is very dangerous)

At present, there are also bypass diodes in the junction box on the market, and there are also a small number of clamping ways to install diodes. At that time, they will only make a fuss about the convenience of clamping, so there are small contact areas, large contact resistance, and gaps between pins and terminals. The contact area is small, the local temperature rise is large when a large current passes, and the heat generated by the bypass diode is unfavorable to the working condition of the diode.

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