Signal source, error code tester, signal generation method and error code test method

Abstract

The invention relates to a signal source, an error code tester, a signal generation method and an error code test method. The signal source comprises a micro controller and at least two clock data recovery chips, wherein the at least two clock data recovery chips are cascaded, and the transmission rates of test signals generated by each clock data recovery chip are different; and the micro controller is used for setting that one clock data recovery chip in the at least two clock data recovery chips generate the test signals, and the other clock data recovery chips are in a bypass mode. According to the signal source, the error code tester, the signal generation method and the error code test method provided by the embodiment of the invention, the at least two clock data recovery chips are adopted, the at least two clock data recovery chips are cascaded, and the micro controller controls one clock data recovery chip to generate the test signals with the necessary rate, so that the cost is low, the instrument structure or method steps are simple, and multi-rate or full-rate error code detection can be achieved.

Description

technical field [0001] The invention relates to the technical field of transmission equipment, in particular to a signal source, a code error tester, a signal generation method and a code error test method. Background technique [0002] In the current transmission products, the generation of high and low frequency signals and bit error transmission testing have always been an important part of the transmission product industry (especially the optical module industry). With the increasing demand for single-wavelength 25G and 100G (25Gx4) R&D and production of leading transmission products has become a field of competition for various manufacturers or related research units, which makes the signal generation and bit error testing equipment for necessary testing of R&D and production transmission products abnormal. importance. However, the current situation is that the production of signal generation and bit error detectors has been monopolized by several manufacturers (such a...

AI Technical Summary

Problems solved by technology

However, the current situation is that the production of signal generation and bit error detectors has been monopolized by several manufacturers (such as Agilent (Keysight), Tektronix (TEKTRONIX) and Anritsu), resulting in very expensive prices (about 150,000 US dollars to 300,000 US dollars) , which makes the manufacturers or research and development institutions of transmission products mass-produce and promote commercial applications of products, increasing the pressure of great research and development or manufacturing costs

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