Method and device for predicting single event effects

Abstract

The invention relates to a method and a device for predicting single event effects. According to the single event effect prediction method, through acquiring not less than five single event effect cross sections-ion LET value data points of a to-be-detected device under heavy ion irradiation, Weibull function curve fitting is carried out on the single event effect cross sections-ion LET value data points to obtain a Weibull curve, the Weibull curve is stepped, parameters of each sensitive region, collection factors and threshold charge of a sensitive unit are calculated and obtained, and according to parameters of all sensitive regions of the sensitive unit, the collection factors and deposited energy, collection charge of the sensitive unit is calculated; and when the collection charge is larger than or equal to the threshold charge, prediction of single event effects happening to the to-be-detected device is carried out. The obtained sensitive region model obtained in the method comprises at least one sensitive region, each sensitive region considers sensitivity differences inside a single sensitive unit, and thus, the sensitive region model is used for accurately predicting when the single event effects happens to the to-be-detected device in corresponding experiment and application environments.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a single event effect prediction method and device. Background technique [0002] Single event effects (Single Event Effects, SEE) refer to the effects of single particles (including heavy ions, protons, neutrons, etc.) Particle Hard Fault, Single Event Function Interrupt, Single Event Burn, Single Event Gate Break, Single Event Transient Pulse, etc. Space vehicles operate in harsh natural radiation environments. Galactic cosmic rays, solar cosmic rays, and high-energy protons, alpha particles, and heavy ions in the capture belt of the geomagnetic field produce single event effects in space electronics systems that seriously threaten the safety of spacecraft. run. According to the statistics of the National Geophysical Data Center of the United States, from 1971 to 1986, the total number of failures caused by various reasons in the 39 geostationary satellites launched by th...

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Problems solved by technology

[0004] However, the RPP / IRPP model approximately considers that the sensitivity inside the sensitive unit is the same, that is, it does not consider the difference in the sensitivity of single event effects within a single sensitive unit

In fact, the electric field distribution, charge collection efficiency, charge collection mechanism, etc. inside a single sensitive unit are different, and it is precisely this difference that causes the relationship between single event effect cross section and ion LET value to be not a step function

Therefore, using this method to predict the single event effect results of the device is not accurate

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