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Wavelength selection based ultraviolet-visible spectrum multi-metal ion detection method

A technology for ion detection and metal ions, which is applied in the field of ultraviolet-visible spectral analysis, can solve the problems of low modeling contribution and the size cannot fully reflect the importance of variables, and achieve the effect of reducing wavelength screening time

Inactive Publication Date: 2016-11-23
CENT SOUTH UNIV
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Problems solved by technology

However, through analysis, it is found that the MC-UVE method is mainly used to eliminate noise wavelength points in the spectrum, and has great limitations in removing non-noise points with low contribution to modeling; the CARS method is a new variable proposed in recent years. Screening theory, which removes invalid variables and minimizes the impact of collinear variables on the model
However, due to the different samples selected by Monte Carlo sampling, the regression coefficient has been changing, and its size cannot fully reflect the importance of variables

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  • Wavelength selection based ultraviolet-visible spectrum multi-metal ion detection method
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  • Wavelength selection based ultraviolet-visible spectrum multi-metal ion detection method

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[0020] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are the Some, but not all, embodiments are invented. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] see figure 1 , in order to quickly and efficiently remove the wavelength variables of inclusion noise and a large number of non-noise wavelength variables that do not contribute much to the model, and further improve the accuracy of the model, this embodiment discloses a method for detecting multi-metal ions in ultraviolet-visible spectra based on wavelength scre...

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Abstract

The invention discloses an ultraviolet-visible spectrum polymetallic ion detection method based on wavelength screening, which can quickly and efficiently eliminate redundant and interference wavelength information, reduce wavelength screening time, and improve the accuracy and robustness of the model. The method comprises: S1, using ultraviolet-visible spectrophotometry to obtain the mixed absorbance of a solution containing multiple metal ions in the full band of 400-700nm; S2, sampling the obtained absorbance by using a multiple cycle Monte Carlo method, and using exponential decay The function preliminarily selects the wavelength, and uses the non-informative variable elimination method to select the effective wavelength point in the mixed absorbance; S3, establishes the regression model between the concentration and the mixed absorbance based on the PLS method, and separates and calculates the concentration of each ion.

Description

technical field [0001] The invention relates to the field of ultraviolet-visible spectrum analysis, in particular to a detection method for ultraviolet-visible spectrum polymetallic ions based on wavelength screening. Background technique [0002] Ultraviolet-visible spectroscopic analysis technology is a high-tech rapid analysis. Due to its simple pretreatment and convenient detection, it has been more and more widely used in the field of analysis and determination of metal ions. However, when using this method to measure the concentration of polymetallic ions, the full-band wavelength information is generally used for PLS modeling. Theoretically, the absorbance at each wavelength point is the sum of the absorbances of various substances and satisfies the Lambert-Beer theorem, but due to experimental errors, instrument noise and the interaction between the components, each wavelength point The contribution of the model is different, and even some wavelength point informati...

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Application Information

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IPC IPC(8): G01N21/31G01N21/33
CPCG01N21/3151G01N21/33G01N2021/3155
Inventor 朱红求邹胜男阳春华李勇刚王雅琳尹冬航王强蒋晓云
Owner CENT SOUTH UNIV
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