Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electronic component automatic measurement and storage system

A technology for electronic components and storage systems, applied in the field of measurement systems, can solve problems such as low efficiency, high error probability, calculation errors, etc., to save manpower, reduce error rate, and improve test efficiency.

Inactive Publication Date: 2016-11-23
天津市普林斯特电子有限公司
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, due to the absence of an intelligent auxiliary management system, operators often need to manually measure the electrical value of electronic components, and then manually calculate and compare the measured value with the standard specification value of electronic components to obtain the results to determine whether the component is According to the specifications, and then according to the calculation results, record whether the corresponding rolls meet the production standards
[0003] When we produce an electronic product, we often need dozens or even hundreds of electronic components, so this method of manual measurement, manual calculation comparison and manual recording process requires a lot of manpower, and the process is cumbersome and time-consuming. Laborious, the probability of error is also high (including calculation errors, recording errors, etc.), low efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electronic component automatic measurement and storage system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0012] Such as figure 1 Shown is the schematic diagram of the patent of the present invention. The automatic measurement and storage system for electronic components described in the patent of the present invention is mainly used to measure whether different types of electronic components meet the specifications. The automatic measurement and storage system for electronic components described in the patent of the present invention mainly includes several measuring devices 1, control devices 2 and storage devices 3. The several measuring devices 1 are used to measure various types of electronic components. The control device 2 can be a computer, and the computer can be equipped with a GPIB industrial control card. The storage device 3 can be a background database server. The plurality of measuring devices 1 are used to measure the electronic components to be tested to obtain the actual electrical value of the electronic components to be tested, and the storage device 3 is used...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the field of a measurement system and especially relates to an electronic component automatic measurement and storage system, which comprises a plurality of measurement devices, a storage device and a control device. The measurement devices are used for measuring electronic components to be measured to obtain actual electrical values; the storage device is used for storing information and actual electrical values of the electronic components to be measured; the control device is connected with the measurement devices and the storage device; and the control device comprises a setting unit, a control unit, a comparison and judgment unit and a display unit, wherein the setting unit is used for setting the information of the electronic components to be measured, the control unit is used for selecting the measurement devices for measuring according the set information to obtain the actual electrical values of the electronic components to be measured, the comparison and judgment unit is used for comparing the actual electrical values and standard electrical values and judging whether the electronic components to be measured meet specifications, and the display unit is used for displaying the judgment result. The system is low in error rate, and thus quality of the electronic components is controlled strictly; and test efficiency is improved, and manpower is effectively saved.

Description

technical field [0001] The patent of the present invention belongs to the field of measurement systems, in particular to an automatic measurement and storage system for electronic components. Background technique [0002] At present, due to the absence of an intelligent auxiliary management system, operators often need to manually measure the electrical value of electronic components, and then manually calculate and compare the measured value with the standard specification value of electronic components to obtain the results to determine whether the component is According to the specification, and then according to the calculation result, record whether the corresponding material roll meets the production standard. [0003] When we produce an electronic product, we often need dozens or even hundreds of electronic components, so this method of manual measurement, manual calculation comparison and manual recording process requires a lot of manpower, and the process is cumbers...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 赵成霖
Owner 天津市普林斯特电子有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products