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Circuit parameter optimization method for V-type line impedance stabilization network

A technology for stabilizing the network and linear impedance, which is applied in the direction of measuring electricity, measuring electrical variables, and components of electrical measuring instruments. It can solve problems that affect the accuracy of test results and large frequency changes in characteristic impedance, and achieve convenient operation and good production performance. Effect

Active Publication Date: 2016-12-07
BEIHANG UNIV
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AI Technical Summary

Problems solved by technology

When the LISN specified in the existing standard is working, the characteristic impedance changes greatly with the frequency, which affects the accuracy of the test results

Method used

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  • Circuit parameter optimization method for V-type line impedance stabilization network
  • Circuit parameter optimization method for V-type line impedance stabilization network
  • Circuit parameter optimization method for V-type line impedance stabilization network

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Embodiment Construction

[0033] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0034]According to the regulations of the International Radio Regulatory Commission on the LISN circuit (Linear Impedance Stabilization Network Circuit) for electromagnetic compatibility tests, the LISN circuit is divided into V-type and Δ-type structures. The invention proposes a new optimization calculation method for V-type LISN circuit parameters, optimizes calculation for V-type LISN circuit parameters, simplifies circuit test steps, and improves circuit test accuracy.

[0035] The flow diagram of a novel linear impedance stable network parameter optimization design method provided by the present invention is as follows: Figure 4 As shown, it specifically includes the following steps:

[0036] Step 1: The basic schematic diagram of the V-type LISN circuit is as follows figure 1 shown. Inductance L and capacitance C in the circuit 2 A low-pa...

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Abstract

The invention relates to a circuit parameter optimization method for a V-type line impedance stabilization network. With the method of the invention adopted, a line impedance stabilization network (LISN) which can keep impedance constant in whole working frequency bands can be designed optimally; with the LISN adopted, it can be ensured that conducted emission experiment results are not affected by the self-impedance variation of the line impedance stabilization network; and algorithm optimized circuit parameter components are adopted, so that the experiment results are not affected by the voltage division of a blocking capacitor in a circuit. The circuit parameter optimization method can play a role of guiding the design and development of a line impedance stabilization network which is better in performance and is more convenient to operate. With the method adopted, line impedance stabilization networks which can be suitable for different tested articles can be designed and developed according to use requirements.

Description

technical field [0001] The invention relates to a V-shaped linear impedance stabilization network circuit parameter optimization, through which a linear impedance stabilization network that maintains a constant impedance in a working frequency band and meets work performance requirements is designed, and belongs to the technical field of electromagnetic compatibility conduction emission testing. Background technique [0002] In the electromagnetic compatibility conduction emission test, due to the different types of connections of the tested product, the power supply impedance at different positions varies greatly, resulting in drastic changes in the load terminal impedance of the tested product, which directly affects the test results of the tested product’s power line conducted emission . In order to make the conducted emission test results of power lines measured in different sites comparable, a linear impedance stabilization network (hereinafter referred to as LISN, Line...

Claims

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Application Information

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IPC IPC(8): G01R1/30G01R31/00
CPCG01R1/30G01R31/001
Inventor 苏东林吕冬翔刘焱陈尧
Owner BEIHANG UNIV
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