Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device for improving laser trimming precision of extreme-value thick film resistor

A thick-film resistor, laser trimming technology, applied in resistors, measuring devices, resistor manufacturing, etc., can solve the problem of low measurement accuracy, and achieve the effects of high trimming accuracy, improved measurement accuracy, and simple structure

Inactive Publication Date: 2016-12-21
EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
View PDF5 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, what the existing resistance measuring device outputs is the actual resistance value of the measured resistance, and the range of the resistance value is determined by the actual resistance value of the resistance value. limit, the measurement accuracy is not high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device for improving laser trimming precision of extreme-value thick film resistor
  • Device for improving laser trimming precision of extreme-value thick film resistor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0020] Such as figure 1 As shown, a device for improving the accuracy of laser trimming of extreme value thick film resistors, which includes a probe card 1, a row of output terminals 1b are arranged on the front of the probe card 1, and the output terminals 1b are inserted into the laser trimming resistance not shown in the figure The input end of the mechanical resistance measurement system, the output end of the probe card and the designated input end are connected in one-to-one correspondence.

[0021] There is an opening 1c in the middle of the probe card 1, and a welding pad 1a is provided on the probe card 1 around the opening 1c. The welding pad 1a is composed of a long strip-shaped electrode distributed radially.

[0022] A resistor 2 with a resistance value of 100Ω is provided on the probe card 1 between a designated port of the output terminal 1b and the pad 1a.

[0023] On the resistor body of the resistor 2, there are two lead-out terminals 3 on the left and righ...

Embodiment 2

[0031] Such as figure 2 As shown, a device for improving the accuracy of laser trimming of extreme value thick film resistors, which includes a probe card 1, a row of output terminals 1b are arranged on the front of the probe card 1, and the output terminals 1b are inserted into the laser trimming resistance not shown in the figure The input end of the mechanical resistance measurement system, the output end of the probe card and the designated input end are connected in one-to-one correspondence.

[0032] There is an opening 1c in the middle of the probe card 1, and a welding pad 1a is provided on the probe card 1 around the opening 1c. The welding pad 1a is composed of a long strip-shaped electrode distributed radially.

[0033] A resistor 2 with a resistance value of 100Ω is provided on the probe card 1 between a designated port of the output terminal 1b and the pad 1a.

[0034] A lead-out terminal 3 is respectively provided on the left and right ends of the resistor body...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a device for improving the laser trimming precision of an extreme-value thick film resistor. The device comprises a probe card (1). The device is characterized in that a resistor (2) is arranged on the probe card (1). The left and right sides of the resistor (2) are provided with two leading-out terminals. Through a lead and a bonding pad (1a) arranged on the probe card (1), a resistance test probe (6) is communicated with an output part (1b) at the front part of the probe card. The device is simple in structure, convenient to use and high in fine adjustment precision. The device is directly modified based on the prior art and is low in modification cost.

Description

Technical field: [0001] The invention relates to a resistance measuring device, in particular to a device for improving the precision of laser trimming of extreme value thick film resistance. Background technique: [0002] Laser trimming is to use laser to selectively and controlly remove part of the thick film resistor material, so that the trimmed thick film resistor can obtain a predetermined resistance value. Laser resistance trimming technology has been used in the 1960s. Due to the high precision of laser trimming resistance adjustment, accurate resistance value can be obtained, the trimming process is fully automatic, and the resistance adjustment efficiency is high. Therefore, it is still the most widely used for trimming thin-thick film circuits. Methods. [0003] The basic process of laser trimming is as follows: 1. The probe detects the resistor; 2. The digital voltmeter measures the resistance value of the resistor; 3. The laser is positioned at the starting poi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/08H01C17/242
CPCG01R27/08H01C17/242
Inventor 李寿胜夏俊生臧子昂姚道俊
Owner EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com