1results about How to "High fine-tuning precision" patented technology

The utility model belongs to the technical field of detection, and discloses a height and rotation angle adjustable electron microscope sample clamp which comprises a support, a base connected to the support, a spherical groove formed in the base, a spherical connecting block connected in the spherical groove in a spherical mode, and a first threaded sleeve connected in the spherical connecting block in a penetrating mode. According to the scheme, the base is provided with the spherical groove and the spherical connecting block to form an adjustable spherical connecting mechanism, and the adjustable spherical connecting mechanism is matched with the first threaded sleeve penetrating through the sphere center and the adjusting rod extending long, so that precise adjustment of the height and the rotating angle of the objective table is achieved, and the fine adjustment precision is improved through the leverage effect of the adjusting rod; the problem of unstable adjustment caused by too short lever arm of a traditional structure is effectively solved; meanwhile, the adjusting rod with anti-skid lines at the bottom end and the liftable positioning block facilitate rapid positioning and resetting, the whole clamp is compact in structure and convenient and fast to operate, and the requirements for multiple angles, height fine adjustment and high stability of sample morphology observation and energy spectrum analysis under the electron microscope can be met.