Method for performing mass-production testing on OTP (one time programmable) type MCUs (microcontroller units) under no test interfaces reserved condition

Abstract

The present invention discloses a method for performing mass-production testing on OTP (one time programmable) type MCUs (microcontroller units) under no test interfaces reserved condition. In a CP1 stage, a test interface is simulated in a program region, and communicates with mass-production ATE (automated test equipment); in a CP1 stage and a CP2 stage, useful information in a calibration region is stored to a public network end; and in a CP3 stage after UV (ultraviolet) erasing, the useful information at the corresponding public network end is written into an OTP storage region. According to the method, the test interface is simulated, so that the access to a module to be tested can be realized, and the test interface can communicate with the ATE, and therefore, the problem that mass-production testing cannot be performed on OTP (one time programmable) type MCUs due to the inexistence of test interfaces can be solved, and the problem that the OTP (one time programmable) type MCUs cannot be tested due to the failure of a certain test interface can be solved.

Description

technical field [0001] The invention belongs to the technical field of chip testing, in particular to a mass production testing method for OTP type MCU products. Background technique [0002] OTP-type MCU products refer to the MCU whose program area is OTP (One Time Programmable), which has the complexity of MCU and the non-erasability of OTP. [0003] Among them, the complexity refers to the design complexity, because the Microcontroller Unit (MCU) is to reduce the frequency and specifications of the Central Processing Unit (Central Process Unit; CPU) appropriately, and the memory (memory), the counter ( Timer), USB, A / D conversion, UART, PLC, DMA and other peripheral interfaces, and even LCD driver circuits are integrated on a single chip to form a chip-level computer. Too many modules lead to complex design and difficult verification [0004] Non-rewritable means that the program space is OTP (One Time Programmable). That is, only one programming can be performed, and n...

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Problems solved by technology

[0010] Based on this, therefore the primary purpose of the present invention is to provide a kind of mass production test method of OTP type MCU under the situation of not reserving test interface, this method realizes module to be tested (as temperature sensor interface) by analog test interface (such as temperature sensor interface) ) and communicate with ATE equipment to solve the problem that the OTP type MCU cannot be mass-produced and tested because there is no "test interface"

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