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Transmitter alc design general test platform and test method

A test platform and test method technology, applied in transmitter monitoring and other directions, can solve the problems of inaccurate output power, loss of peak useful signal, and influence of vector signal modulation quality, so as to avoid overdrive damage and improve linearity.

Active Publication Date: 2020-09-22
NANJING PANDA ELECTRONICS +1
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  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

However, for pure analog ALC for non-constant envelope peak-to-average ratio modulation signals (such as OFDM modulation), if effective value detection is used, it will cause the loss of peak useful signals and affect the modulation quality of vector signals; and if peak detection is used, it will Inaccurate output power

Method used

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  • Transmitter alc design general test platform and test method
  • Transmitter alc design general test platform and test method
  • Transmitter alc design general test platform and test method

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Embodiment Construction

[0038] The present invention will be further described below in conjunction with the accompanying drawings.

[0039] The specific block diagram and cascading method of the general test platform for transmitter ALC design are as follows: figure 1As shown, including pre-stage coupler, RF switch, digital control attenuator, analog attenuator, drive amplifier, final power amplifier, post-stage power coupler, low-pass filter, pre-stage chip detector, post-stage chip detector , Loop control circuit, analog single-pole double-throw switch, MCU microprocessor, I2C memory.

[0040] The functions of each part of the functional circuit are as follows:

[0041] 1. Pre-stage coupler; it is used to detect the magnitude of the pre-stage input signal, which can be used to pre-store the numerical control attenuation in the current mode by comparing the front and rear stage signals in different modes;

[0042] 2. RF switch: When measuring the unknown signal size of the previous stage, it is u...

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Abstract

The invention provides a transmitter ALC (Automatic Level Control) design universal test platform, which comprises a preceding-stage coupler, a radio frequency switch, a digital control attenuator, an analog attenuator, a driving amplifier, a final-stage power amplifier, a latter-stage power coupler, a low-pass filter, a preceding-stage chip detector, a latter-stage chip detector, a loop control circuit, an analog single-pole double-throw switch, a MCU (Micro-programmed Control Unit) microprocessor, and an I2C storage. The test platform provided by the invention is relatively strong in utility, can provide three typical ALC control modes for a transmitter to achieve prestored type digital ALC control, analog closed loop modulation type ALC control, and a digital-analog combined control ALC control mode, and different control modes can achieve the aims of high-linearity control, high-speed analog control, and high-reliability control. According to different requirements, parts of circuits are modified to highlight characteristics of certain indexes, and provide a scheme support for a final product.

Description

technical field [0001] This patent designs a transmitter ALC (automatic level control) design test platform, specifically relates to a general transmitter ALC design test platform. Background technique [0002] With the development of digital communication, the development of low-speed to high-speed communication, whether it is civilian military communication or EMI testing, the radio frequency transmission part is inseparable. Usually, the stability of the output power of the transmitter must be guaranteed. ALC The loop control is the premise to ensure the stability of the output power of the transmitter. Usually when the design of a certain project is finally completed, it is enough to adopt a certain fixed ALC control method. Whether it is open-loop control or closed-loop control, whether it is analog control or digital control is determined, so that we can ensure the lowest cost of the product. , the fastest control speed, the best quality of the transmitted signal, and...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/15
CPCH04B17/15
Inventor 孙正健
Owner NANJING PANDA ELECTRONICS
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